MRI: Acquisition of a Low-Vacuum SEM Microscope for Multi-Disciplinary Research and Education

0116385 Scherer该奖项由重大研究仪器计划颁发，为购买低真空扫描电子显微镜(LV SEM)提供部分支持。主要调查人员包括来自北伊利诺伊大学文理学院三个不同系的四名教职员工。PIS的LV扫描电子显微镜的主要应用包括：研究冰川沉积过程和极地浮游生物的生物地层学和演化，研究冰川下沉积物的微结构；环境生物地理学，包括分析参与有机溶剂生物降解的微生物的空间分布；研究现代土壤和第四纪古土壤，以检查它们当前和历史上的固碳能力；植物形态和分类学、民族植物学、保护生物学和植物生物复杂性的研究；以及在教育项目中的应用，包括研究培训、本科课程和社区推广教育项目。将要购买的仪器是JEOL 5600LV，它可以在高真空或低真空下工作，使用Noran Vantage DSI光谱成像系统X射线分析仪(EDS)。用于观察的样本几乎不需要任何前处理，大样本(最大15厘米)无需镀金即可成像。这是一种非破坏性的方法，非常适合检查独特的样品，如全息模型或人工制品，可以直接分析潮湿或放出气体的样品。***

0116385SchererThis award, made through the Major Research Instrumentation Program, provides partial support for the acquisition of a low vacuum scanning electron microscope (LV SEM). The principal investigators include four faculty members from three different departments in the College of Liberal Arts and Sciences at Northern Illinois University. Principal applications of the LV SEM by the PIs include: studies of glacial-sedimentary processes and polar plankton biostratigraphy and evolution entailing examination of microstructures in subglacial sediments; studies in the environmental biogeosciences, including analysis of the spatial distribution of microorganisms involved in biodegradation of organic solvents; studies of modern soils and Quaternary paleosols to examine their current and historic ability to sequester carbon; studies in plant morphology and systematics, ethnobotany, conservation biology, and botanical biocomplexity; and applications in educational programs, including research training, undergraduate coursework, and community outreach education programs. The instrument to be purchased is the JEOL 5600LV, which can operate at either high vacuum or low vacuum, with the Noran Vantage DSI spectral imaging system X-ray analyzer (EDS). Samples for observation require virtually no pretreatment, and large samples (up to 15 cm) can be imaged without gold-coating. This is a non-destructive method, perfect for examination of unique specimens, such as holotypes or artifacts, and wet or outgassing samples can be directly analyzed. ***