Acquisition of a Field Emission Scanning Electron Microscope (FESEM) to Enhance Research and Education in Engineered Particulates

OIA-0116595PI：DavePI和机械工程部门和化学工程部门的四名同事申请资金购买场发射扫描电子显微镜(FESEM)。这台仪器将用于他们在粒子技术方面的研究。这将增强他们在纳米和亚微米尺度上表征颗粒的能力。当这些数据被纳入到他们的预测数值模型中时，预计会有更好的结果。NJIT的制度支持非常强大，成本分担在~50%的水平。

OIA-0116595PI: DaveAbstractThe PI and four colleagues in the Mechanical Engineering and the Chemical Engineering Departments request funding for the purchase of a field emission scanning electron microscope (FESEM). This instrument will be used in their research in particle technology. It will enhance their capability to characterize particles at nano and submicron scales. When such data are incorporated into their predictive numerical model, better results are anticipated. The institutional support of NJIT is very strong with cost-sharing at ~50% level.