Research for Mixed Signal Electronic Technologies: A Joint Initiative Between NSF and SRC - Three Dimensional Planar Device Integration for Mixed Signal Electronics

混合信号电子技术研究:NSF 和 SRC 的联合倡议 - 混合信号电子的三维平面器件集成

基本信息

  • 批准号:
    0120278
  • 负责人:
  • 金额:
    $ 15.71万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Standard Grant
  • 财政年份:
    2001
  • 资助国家:
    美国
  • 起止时间:
    2001-09-15 至 2005-08-31
  • 项目状态:
    已结题

项目摘要

This research effort is directed to providing a novel solution to the problems that occur with mixed-signal integration by using three-dimensional implementation of planar silicon transistors. The planned research will explore mixed signal technology's viability through research and development of device and process technology incorporating digital and analog planar transistor structures in different single-crystal device planes using techniques of single-crystal silicon layer transfer at low temperatures and by isolating the digital and analog functions with a ground-plane in between. This will be done while continuing to allow a large interconnection density in the horizontal and vertical direction for signal transmission. In order to make this feasible, transfer of thin (100's of nm) layers of single-crystal silicon on a planarized low roughness silicon dioxide surface at temperatures below 550 C has been demonstrated. Interconnections and ground planes based on doped poly-silicon and/or tungsten are incorporated in between the single-crystal silicon planes. The use of multiple planes, with oxide in between, also allows incorporation of other passive elements while limiting the increase in area together with a reduction in the loss effects of high frequencies. It is expected that this approach will reduce noise and cross-talk through the use of ground-planes and reduced coupling. This should provide additional freedom in the design of analog transistors, such as the metal-oxide semiconductor field-effect transistors in this project. This approach is also compatible with and can incorporate other developments in passive elements, such as high quality factor inductors, filters, etc., in back-end of the fabrication process. This research addresses significant issues for potential industrial applications , as analog and digital technologies can differ from each other in quite substantial ways because of the design requirements inherent to high frequency or low power. Maintaining low cost, the need for operation at low power, and the circuit and systems issues arising from interference between analog signals and digital signals are a few of these challenges.
这项研究工作旨在通过使用平面硅晶体管的三维实现来为混合信号集成所出现的问题提供一种新的解决方案。计划中的研究将探索混合信号技术的可行性,方法是研究和开发在不同单晶器件平面上结合数字和模拟平面晶体管结构的器件和工艺技术,使用低温单晶硅层转移技术,并通过在两者之间使用接地板隔离数字和模拟功能。这将在继续允许用于信号传输的水平和垂直方向上的大的互连密度的同时进行。为了使这一点成为可能,在550℃以下的平坦化的低粗糙度二氧化硅表面上实现了单晶硅薄层(100‘S纳米)的转移。基于掺杂多晶硅和/或钨的互连和接地面被结合在单晶硅平面之间。使用多个平面,中间有氧化物,还允许结合其他无源元件,同时限制面积的增加以及减少高频的损耗影响。预计这种方法将通过使用接地面和减少耦合来减少噪声和串扰。这将为模拟晶体管的设计提供额外的自由度,例如本项目中的金属氧化物半导体场效应晶体管。该方法还与制造工艺后端的无源元件(如高品质因数电感、滤波器等)的其他开发兼容,并可结合这些开发。这项研究解决了潜在工业应用的重大问题,因为由于高频或低功率固有的设计要求,模拟和数字技术可能在很大程度上彼此不同。保持低成本、在低功率下运行的需要以及模拟信号和数字信号之间的干扰引起的电路和系统问题是这些挑战中的一小部分。

项目成果

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Sandip Tiwari其他文献

CMOS and memories: From 100 nm to 10 nm!: Invited Paper
  • DOI:
    10.1016/s0167-9317(99)00004-0
  • 发表时间:
    1999-05-01
  • 期刊:
  • 影响因子:
  • 作者:
    Sandip Tiwari;Paul M. Solomon;J.J. Welser;E.C. Jones;F.R. McFeely;E. Cartier
  • 通讯作者:
    E. Cartier
Hot-Melt Extrusion–Based Fused Deposition Modeling 3D Printing of Atorvastatin Calcium Tablets: Impact of Shape and Infill Density on Printability and Performance
基于热熔挤出的熔融沉积建模 3D 打印阿托伐他汀钙片:形状和填充密度对适印性和性能的影响
  • DOI:
  • 发表时间:
    2022
  • 期刊:
  • 影响因子:
    3.3
  • 作者:
    Preethi Mandati;N. Dumpa;Abdullah A. Alzahrani;Dinesh Nyavanandi;Sagar Narala;Honghe Wang;S. Bandari;M. Repka;Sandip Tiwari;Nigel Langley
  • 通讯作者:
    Nigel Langley

Sandip Tiwari的其他文献

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{{ truncateString('Sandip Tiwari', 18)}}的其他基金

Transistor-Based and Voltage-Compatible Nanoscale Memories and Configurable Elements using Phase Transitions
基于晶体管且电压兼容的纳米级存储器和使用相变的可配置元件
  • 批准号:
    1128518
  • 财政年份:
    2011
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
Workshop: Interdisciplinary Challenges beyond the Scaling Limits of Moore's Law. To Be Held in Arlington, VA, August 2-4, 2010.
研讨会:超越摩尔定律范围的跨学科挑战。
  • 批准号:
    1047541
  • 财政年份:
    2010
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
Nanotechnology Research Instrumentation in Support of NNIN (2008)
支持 NNIN 的纳米技术研究仪器 (2008)
  • 批准号:
    0821565
  • 财政年份:
    2008
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
International Research Experience in Nanotechnology-NNIN and NIMS
国际纳米技术研究经验-NNIN和NIMS
  • 批准号:
    0727552
  • 财政年份:
    2007
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
Nanotechnology Research Instrumentation in Support of NNIN (2007)
支持 NNIN 的纳米技术研究仪器 (2007)
  • 批准号:
    0722812
  • 财政年份:
    2007
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
REU Site: Research Experience in Nanoscale Science, Engineering and Technology at NNIN
REU 网站:NNIN 纳米科学、工程和技术的研究经验
  • 批准号:
    0649215
  • 财政年份:
    2007
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Continuing grant
MRI 2006: Acquisition of Nanotechnology Instrumentation within NNIN: Consortium Proposal
MRI 2006:在 NNIN 内收购纳米技术仪器:联盟提案
  • 批准号:
    0619495
  • 财政年份:
    2006
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
MRI: Acquisition of Instrumentation for Nanoscale Characterization and Fabrication (NNIN Consortium Proposal)
MRI:采购用于纳米级表征和制造的仪器(NNIN 联盟提案)
  • 批准号:
    0521211
  • 财政年份:
    2005
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
MRI: Acquisition of Instrumentation for Characterization and Fabrication of Hard and Soft Structures for Remote and On-Site National Usage (NNIN Consortium)
MRI:采购用于表征和制造硬结构和软结构的仪器,供远程和现场国家使用(NNIN 联盟)
  • 批准号:
    0420995
  • 财政年份:
    2004
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant
Nanotechnology: Interdisciplinary Research and Education Workshop; August 11-13, 2004; Bangalore, India
纳米技术:跨学科研究和教育研讨会;
  • 批准号:
    0434513
  • 财政年份:
    2004
  • 资助金额:
    $ 15.71万
  • 项目类别:
    Standard Grant

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基于MIXED Transformer和DS-TransUNet构建嵌入椎旁肌退变量化模块的体内校准骨密度模型检测骨质疏松的可行性研究。
  • 批准号:
    82302303
  • 批准年份:
    2023
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新型量化器低功耗混合信号LSI的研究
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