ITR: Methodologies for Robust Design of Information Systems under Multiple Sources of Uncertainty

ITR：多种不确定性来源下的信息系统鲁棒设计方法

• 批准号: 0205227
• 负责人: David Blaauw
• 金额: --
• 依托单位: Regents of the University of Michigan - Ann Arbor
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-08-01 至 2008-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0205227&HistoricalAwards=false
• 关键词: ITR; Methodologies; Robust; Design; Information

As CMOS technology enters the nanometer-regime, one of the most fundamental challenges will result from the loss of predictability of design behavior due to both variations during manufacturing and interferences between components during normal operation. As features on the die continue to shrink, control of the physical parameters, such as the feature size of transistors, their doping levels, and oxide thickness, will become increasingly difficult to control, resulting in dramatic increased uncertainty in the electrical characteristics of individual devices. Also, the close proximity of devices to each other will give rise to significant interference from elements surrounding a device, due to inductive and capacitive coupling, and due to environmental factors, such as power supply and temperature fluctuations. The increase in the number of uncertainties, as well as their severity will result in a general loss of predictability in nanometer-CMOS design and will threaten the ability to produce robust designs. In this project, we are developing a statistical framework for analysis and optimization of system performance, power, and functional integrity, as well as their newly emerging trade-offs in nanometer design. In the presence of variations due to process fluctuations and environmental interferences, signals are inherently stochastic as are the basic measures of design quality, such as delay and power. The research is therefore investigating the development of stochastic models for performance metrics that capture their dependence on the various sources of uncertainty. The new design methodology will focus on robustness as a new measure of design quality, including delay, power consumption and measures of functional integrity, and will allow these design objectives to be constrained at prescribed levels of confidence. Furthermore, the research team is considering new methods for simultaneous optimization of performance, energy, and functional integrity that effectively exploit new trade-offs and interactions between these objectives in nanometer design.

随着CMOS技术进入纳米级，最根本的挑战之一将是由于制造过程中的变化和正常操作期间组件之间的干扰而导致的设计行为的可预测性的丧失。随着管芯上的特征持续缩小，物理参数（诸如晶体管的特征尺寸、其掺杂水平和氧化物厚度）的控制将变得越来越难以控制，从而导致单个器件的电特性的不确定性显著增加。此外，由于电感和电容耦合，以及由于环境因素，例如电源和温度波动，设备彼此的紧密接近将引起来自设备周围的元件的显著干扰。不确定性数量的增加及其严重性将导致纳米CMOS设计中可预测性的普遍丧失，并将威胁到产生鲁棒设计的能力。在这个项目中，我们正在开发一个统计框架，用于分析和优化系统性能，功耗和功能完整性，以及纳米设计中新出现的权衡。在由于过程波动和环境干扰而存在变化的情况下，信号本质上是随机的，设计质量的基本度量也是随机的，例如延迟和功率。因此，本研究正在调查性能指标的随机模型的发展，以捕捉它们对各种不确定性来源的依赖。新的设计方法将侧重于稳健性，将其作为设计质量的新衡量标准，包括延迟、功耗和功能完整性的衡量标准，并将使这些设计目标受到规定置信水平的约束。此外，研究小组正在考虑同时优化性能、能量和功能完整性的新方法，这些方法有效地利用了纳米设计中这些目标之间的新权衡和相互作用。