Collaborative Research/GOALI: Analysis and Optimization Method for Distributed Sensor Systems in Electronics Assembly Processes Systems

这种合作研究/赠款机会学术联络与工业（GOALI）提供资金的开发和实施的方法，用于分析和优化的分布式传感器系统在电子装配过程中的过程故障诊断的目的。 建议的建模工具将产品质量信息和过程特性集成在一个多站装配系统的框架，使用一个站索引的状态空间模型。然后，一个通用的分布式传感器系统的可诊断性将探讨通过扩展控制理论中的可观性的概念。这将进一步导致基于多元数据分析的故障特征提取的故障诊断方法的发展。 状态空间质量-故障模型和可诊断性分析提供了对质量信息转换的理解，这将指导传感系统的优化设计。 该项目将通过与德克萨斯农工大学、威斯康星州-麦迪逊大学和摩托罗拉佛罗里达研究实验室（MFRL）的密切合作进行。该方法的开发将以摩托罗拉无线电装配过程为基础，并将在该过程中测试和实施所产生的技术。 如果成功，该项目的成果将有助于传感和信息技术在制造业：新的概念和标准，有关传感器系统的性能将被定义和有效的算法，传感优化和数据分析将被开发。基于研究成果开发的课程将对质量工程和生产系统的教育产生长远的影响。由此产生的技术也将使美国电子制造商受益，他们正面临来自国际竞争对手的巨大压力。根据互连技术研究所1999年发布的一份白色文件，在过去的五年里，美国650家电子制造商中有100多家倒闭。缺乏六西格玛质量被认为是美国制造商最薄弱的环节。由此产生的方法的工业实施将有助于美国制造商保持竞争力，并可能产生重大的经济影响。

This Collaborative Research/Grant Opportunities for Academic Liaison with Industry (GOALI) provides funding for the development and implementation of a methodology for the analysis and optimization of a distributed sensor system in electronics assembly processes for the purpose of process fault diagnosis. The proposed modeling tool will integrate product quality information and process characteristics in a multi-station assembly system framework using a station-indexed state space model. Then, the diagnosability of a generic distributed sensor system will be explored by expending the concept of observability in control theory. This will further lead to development of the fault diagnosis method for fault feature extraction based on the multivariate data analysis. The understanding of the transformation of quality information, offered by the state space quality-fault model and diagnosability analysis, will guide the optimal design of a sensing system. This project will be carried out through a close collaboration partnered by Texas A&M University, the University of Wisconsin - Madison, and Motorola Florida Research Labs (MFRL). The methodology development will be based on, and the resulting technology will be tested and implemented in, the Motorola radio assembly process. If successful, the results of this project will contribute to sensing and information technology in manufacturing: new concepts and criteria regarding the performance of sensor systems will be defined and effective algorithms for sensing optimization and data analysis will be developed. Curriculum developed from research accomplishments will generate long-term impacts on the education of quality engineering and production system. The resulting technology will also benefit the US electronics manufacturers who are under great pressure from their international competitors. According to a White Paper issued by the Interconnection Technology Research Institute in 1999, over 100 of 650 U.S. electronics fabricators have gone out of business in the past five years. The lack of six-sigma quality is identified as the weakest point of for US manufacturers. Industrial implementation of the resulting methodology will aid US manufacturers in remaining competitive and could generate substantial economic impacts.