SBIR Phase I: Dynamic 2D Depth Oriented Y-Z (X-Z) Opto-electronic Position Detector Using Photo Sensitive Semiconductor and Laser Light

这项小型企业创新研究（SBIR）第一阶段项目旨在验证创新的概念，并阐明构建单个仪器的系统和关键组件要求，以检测在面向深度的2D空间中运动物体的位置。该仪器将有输出信号，从基础位置识别物体在不同方向上的位置。该仪器将使用激光照射物体，并使用光敏半导体将反射图像转换为信号。用激光束测量距离和数字化图像是两种类似技术应用的例子。然而，它们仅限于平面数字图像或平面x-y坐标系。在深度定向的二维Y-Z视场中检测物体的位置需要多种仪器和复杂而昂贵的系统。这项研究的应用主要是在自动化制造过程控制领域，但也可以应用于数字化艺术和其他固定物体的建筑。在Y-Z（或X-Z）视场中探测和定位二维深度物体的技术仍处于起步阶段。本研究旨在提高对非金属材料物体（如塑料、纸张、橡胶、织物和岩石）二维深度定向位置的检测和监测方法的理解。

This Small Business Innovation Research (SBIR) Phase I project aims to verify the concept of the innovation and clarify the systems and critical component requirements for building a single instrument to detect the position of an object in motion in a depth oriented 2D space. The instrument will have output signals that identify the position of the object in the different directions from a base location. The instrument will use a laser light to illuminate the object with and photosensitive semiconductor to translate the reflected image into a signal. Measuring the distance with a laser beam and digitizing images are examples of two uses of similar technologies. However, they are limited to flat digital pictures or flat x-y coordinate systems. Detecting the position of an object in a depth oriented two-dimensional Y-Z field of view requires multiple instruments and complex and expensive systems. The application of this research is primarily in the area of automated manufacturing process control but may also apply to architecture for digitizing art and other stationary objects.The technology available to detect and locate objects in a two-dimensional depth oriented Y-Z (or X-Z) field of view is still in its infancy. This research aims to improve the understanding of the methods with which to detect and monitor the 2D depth oriented position of objects that are of non-metallic materials such as plastic, paper, rubber, fabrics, as well as rocks.