IMR: Aquisition of Cryogenic Prober for Nanoscale Materials and Device Characterization

IMR：获取用于纳米级材料和器件表征的低温探针

• 批准号: 0414901
• 负责人: Theresa Mayer
• 金额: --
• 依托单位: Pennsylvania State Univ University Park
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2004
• 资助国家: 美国
• 起止时间: 2004-09-15 至 2007-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0414901&HistoricalAwards=false
• 关键词: IMR; Aquisition; Cryogenic; Prober; Nanoscale

The Instrumentation for Materials Research (IMR) funding provided to this program will be used to purchase a Micromanipulated Cryogenic Probe Station. This instrument will facilitate temperature-dependent characterization of a variety of materials and devices being fabricated in the Penn State Materials Research Science and Engineering Center for Nanoscale Science including ferroelectric thin films and nanotubes, semiconductor and superconductor nanowires, and metal-molecule-metal junctions. These measurements will provide insight into fundamental materials properties such as domain wall motion in scaled ferroelectric thin films and electrical transport in one-dimensional nanostructures. This system offers advantages over conventional cryostats for these samples because it eliminates potentially damaging device packaging (i.e., dicing, mounting, and wire bonding) steps by incorporating six independently controlled micro-manipulated low-noise probes that are used to contact devices across a large sample diameter. In addition, the ability to probe multiple devices in a single cool down will make it easier to collect data on device-to-device variations, which have proven to be significant in many new nanoscale materials such as those described here. The cryogenic probe system will also have broader educational impact in undergraduate research and laboratory-based coursework. Several new laboratory modules will be incorporated into existing undergraduate and graduate physics and electrical engineering courses to provide instruction on temperature-dependent measurement of physical effects in nanoscale materials and devices.The Instrumentation for Materials Research (IMR) funding provided to this program will be used to purchase a Micromanipulated Cryogenic Probe Station. This instrument incorporates six independently controlled probes that are used to contact individual on-chip devices, which are maintained at temperatures between 4 and 300 K by a continuous flow liquid helium cryostat. The probe station will facilitate temperature-dependent characterization of a variety of new devices being fabricated in the Penn State Materials Research Science and Engineering Center for Nanoscale Science including ferroelectric thin films and nanotubes, semiconductor and superconductor nanowires, and metal-molecule-metal junctions. These measurements will provide insight into fundamental materials properties such as domain wall motion in scaled ferroelectric thin films and electrical transport in one-dimensional nanostructures. The cryogenic probe system will also have broader educational impact in undergraduate research and laboratory-based coursework. Several new laboratory modules will be incorporated into existing undergraduate and graduate physics and electrical engineering courses to provide instruction on temperature-dependent measurement of physical effects in nanoscale materials and devices.

为该计划提供的材料研究仪器（IMR）资金将用于购买微操纵低温探针站。 该仪器将有助于在宾夕法尼亚州立大学材料研究科学与纳米科学工程中心制造的各种材料和设备的温度相关特性，包括铁电薄膜和纳米管，半导体和超导体纳米线以及金属-分子-金属结。 这些测量将提供深入了解基本的材料特性，如畴壁运动在缩放的铁电薄膜和电输运在一维纳米结构。 该系统为这些样品提供了优于常规低温恒温器的优点，因为它消除了潜在的破坏性装置包装（即，切割、安装和引线键合）步骤，通过结合六个独立控制的微操纵低噪声探针，这些探针用于在大的样品直径上接触器件。 此外，在一次冷却中探测多个器件的能力将使收集器件间变化的数据变得更加容易，这在许多新的纳米级材料中已经被证明是重要的，如本文所述。 低温探头系统还将在本科研究和实验室课程中产生更广泛的教育影响。 几个新的实验室模块将被纳入现有的本科生和研究生物理和电气工程课程，以提供纳米材料和器件中物理效应的温度依赖测量的指导。提供给该计划的材料研究仪器（IMR）资金将用于购买微操纵低温探针站。 该仪器采用了六个独立控制的探针，用于接触单个芯片上的器件，这些器件通过连续流动液氦低温恒温器保持在4和300 K之间的温度。 该探针站将促进在宾夕法尼亚州立大学材料研究科学与纳米科学工程中心制造的各种新器件的温度依赖性表征，包括铁电薄膜和纳米管，半导体和超导体纳米线以及金属-分子-金属结。 这些测量将提供深入了解基本的材料特性，如畴壁运动在缩放的铁电薄膜和电输运在一维纳米结构。 低温探头系统还将在本科研究和实验室课程中产生更广泛的教育影响。 几个新的实验室模块将被纳入现有的本科生和研究生物理和电气工程课程，以提供在纳米材料和设备的物理效应的温度依赖性测量的指令。