IMR: Aquisition of Cryogenic Prober for Nanoscale Materials and Device Characterization

向该计划提供的材料研究仪器(IMR)资金将用于购买一个微操纵低温探测器站。该仪器将有助于对宾夕法尼亚州立大学材料研究科学和工程中心纳米科学工程中心正在制造的各种材料和设备进行随温度变化的表征，包括铁电薄膜和纳米管、半导体和超导纳米线以及金属-分子-金属结。这些测量将提供对基本材料性质的洞察，如规模化铁电薄膜中的磁区壁运动和一维纳米结构中的电子输运。与传统的低温恒温器相比，该系统为这些样品提供了优势，因为它结合了六个独立控制的微操作低噪声探头，用于接触大直径样品的器件，从而消除了潜在的破坏性器件封装(即切割、安装和引线键合)步骤。此外，在一次降温中探测多个设备的能力将使收集设备到设备变化的数据变得更容易，这些变化已被证明在许多新的纳米材料中具有重要意义，如本文所述的那些。低温探测器系统还将在本科生研究和基于实验室的课程工作中产生更广泛的教育影响。几个新的实验室模块将被纳入现有的本科生和研究生物理和电气工程课程，以提供纳米材料和设备中物理效应的随温度变化的测量指导。向该计划提供的材料研究仪器(IMR)资金将用于购买一个微操纵低温探测站。该仪器集成了六个独立控制的探头，用于接触单个芯片上的设备，这些设备通过连续流动的液氦低温恒温器保持在4至300K之间的温度。该探测站将促进宾夕法尼亚州立大学材料研究科学和工程中心纳米科学工程中心正在制造的各种新设备的温度相关表征，包括铁电薄膜和纳米管、半导体和超导纳米线以及金属-分子-金属结。这些测量将提供对基本材料性质的洞察，如规模化铁电薄膜中的磁区壁运动和一维纳米结构中的电子输运。低温探测器系统还将在本科生研究和基于实验室的课程工作中产生更广泛的教育影响。几个新的实验室模块将被纳入现有的本科生和研究生物理和电气工程课程，以提供纳米材料和设备中物理效应的温度相关测量指导。

The Instrumentation for Materials Research (IMR) funding provided to this program will be used to purchase a Micromanipulated Cryogenic Probe Station. This instrument will facilitate temperature-dependent characterization of a variety of materials and devices being fabricated in the Penn State Materials Research Science and Engineering Center for Nanoscale Science including ferroelectric thin films and nanotubes, semiconductor and superconductor nanowires, and metal-molecule-metal junctions. These measurements will provide insight into fundamental materials properties such as domain wall motion in scaled ferroelectric thin films and electrical transport in one-dimensional nanostructures. This system offers advantages over conventional cryostats for these samples because it eliminates potentially damaging device packaging (i.e., dicing, mounting, and wire bonding) steps by incorporating six independently controlled micro-manipulated low-noise probes that are used to contact devices across a large sample diameter. In addition, the ability to probe multiple devices in a single cool down will make it easier to collect data on device-to-device variations, which have proven to be significant in many new nanoscale materials such as those described here. The cryogenic probe system will also have broader educational impact in undergraduate research and laboratory-based coursework. Several new laboratory modules will be incorporated into existing undergraduate and graduate physics and electrical engineering courses to provide instruction on temperature-dependent measurement of physical effects in nanoscale materials and devices.The Instrumentation for Materials Research (IMR) funding provided to this program will be used to purchase a Micromanipulated Cryogenic Probe Station. This instrument incorporates six independently controlled probes that are used to contact individual on-chip devices, which are maintained at temperatures between 4 and 300 K by a continuous flow liquid helium cryostat. The probe station will facilitate temperature-dependent characterization of a variety of new devices being fabricated in the Penn State Materials Research Science and Engineering Center for Nanoscale Science including ferroelectric thin films and nanotubes, semiconductor and superconductor nanowires, and metal-molecule-metal junctions. These measurements will provide insight into fundamental materials properties such as domain wall motion in scaled ferroelectric thin films and electrical transport in one-dimensional nanostructures. The cryogenic probe system will also have broader educational impact in undergraduate research and laboratory-based coursework. Several new laboratory modules will be incorporated into existing undergraduate and graduate physics and electrical engineering courses to provide instruction on temperature-dependent measurement of physical effects in nanoscale materials and devices.