CAREER: Vertically Integrated Program Analysis for Embedded Software

职业：嵌入式软件垂直集成程序分析近年来，在开发嵌入式软件的工具支持方面取得了很大进展。工具解决了各种各样的难题，例如，通过自动化容易出错的实现任务，通过消除冗余和低效的结构，以及通过保证不存在某些类型的错误，例如竞态条件或内存不足异常。这项nsf CAREER研究是关于垂直集成程序分析和转换（VIPAT）的，这是一种看待嵌入式软件工具的新方法：作为构建块的集合，可以以不同的方式连接在一起，以支持新的分析和转换。现有的工具变成了由高层策略控制的机制。VIPAT基于两个主要思想。首先，在不同抽象层次上操作的工具的垂直集成，它允许高级转换精确地定位于低层次资源使用最差的系统的目标部分。二是机制和政策相分离，在新形势下有效运用现有工具。这项研究是朝着这样一个世界迈出的一步，在这个世界中，可以对程序行为做出有意义的静态保证，并且软件可以自动专业化，以满足特定于平台和应用程序的需求，例如时间和能量限制。高级愿景是“无所畏惧的重用”：开发人员应该花更少的时间担心他们重用的组件的资源使用和潜在的故障模式。

CAREER: Vertically Integrated Program Analysis for Embedded SoftwareIn recent years, a great deal of progress has been made towards toolsupport for developing embedded software. Tools solve a variety ofdifficult problems, for example by automating error-proneimplementation tasks, by eliminating redundant and inefficientconstructs, and by guaranteeing the absence of certain classes oferrors, such as race conditions or out-of-memory exceptions. ThisNSF CAREER research is about Vertically Integrated Program Analysis andTransformation (VIPAT), a new way to look at embedded software tools:as a collection of building blocks that can be connected together indifferent ways to support novel analyses and transformations. Theexisting tools become mechanisms that are controlled by a high-levelpolicy. VIPAT is based on two main ideas. First, the verticalintegration of tools that operate at various levels of abstraction,which permits high-level transformations to be precisely targeted atparts of a system whose low-level resource usage is worst. Second, aclean separation between mechanism and policy, enabling effectivereuse of existing tools in new situations. This research is a steptowards a world where meaningful static guarantees about programbehavior can be made, and where software can be automaticallyspecialized to meet platform- and application-specific requirementssuch as time and energy constraints. The high-level vision is"fearless reuse": developers should spend less time worrying aboutresource usage and potential failure modes of components that theyreuse.