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SBIR Phase I: Laser Spectrometer for Semiconductor Yield Improvement

SBIR Phase I: Laser Spectrometer for Semiconductor Yield Improvement
SBIR 第一阶段:用于提高半导体良率的激光光谱仪
批准号:
0509692
负责人:
Jeffrey Pilgrim
金额:
$0.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2005
资助国家:
美国
项目状态:
已结题
起止时间:
2005-07-01 至 2005-12-31

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中文摘要
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英文摘要
This Small Business Innovation Research Phase I research project will determine the performance and operating specifications for a new laser spectrometer suitable for detection of trace moisture at semiconductor process tools. Trace moisture contamination has an adverse, costly, effect on semiconductor manufacturing yields. The sensor will be about the size of a can of soda and provide single digit parts-per-billion (ppb) sensitivity in a few seconds, 0.25 ppb in under a minute. The estimated price point with volume production will be a factor of four to five lower than present trace moisture sensors. The fully developed rugged prototypes will be suitable for detection of moisture in a variety of toxic, corrosive or inert process gases. The significantly improved price point will enable semiconductor manufacturers to deploy the sensors on each process tool throughout the manufacturing facility. If successful this project will reduce the cost of manufacturing microelectronic semiconductor chips. The basic technology shall extend to other trace gas detection applications including biomedical breath diagnosis. Additional applications abound in detection of trace environmental species important to health, occupational safety, and global warming. The performance and price point of the proposed sensor will enable widespread distribution to scientific researchers in various fields of discovery.
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