Electronanoindentation: Fundamental Investigations and Applications to Piezoelectric Thin Films

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Electronanoindentation: fundamental investigations and applications topiezoelectric thin films by Lawrence Friedman and Christopher MuhlsteinNanoindentation is the work horse of mechanical characterization at the micro- and nano-scale. It is proposed to use electrically conducting indenters to provide independentindentation contact area measurements in situ as well as to investigate coupled electro-mechanical properties of piezoelectric films, including novel applications such as strain-rate sensitivity, fatigue, and application to non-conducting samples via appropriate sample preparation. The proposed research achieves broader impacts via a number of channels. First, the proposed topic is one of great interest across many fields for reasons just mentioned. Second, it is development of new instrumentation and measurement techniques. Third, it enhances existing NSF-supported infrastructure. Fourth, it involves collaboration with researchers in related disciplines. Fifth, it will provide research opportunities and exposure for traditionally underrepresented groups in Science and Engineering. Sixth, it will directly enhance the education of Penn State undergraduateand graduate students.