SBIR Phase I: Process Control Sensor for Fine Particles

SBIR 第一阶段：细颗粒过程控制传感器

• 批准号: 0711961
• 负责人: Craig Saltiel
• 金额: --
• 依托单位: Scattering Solutions
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-07-01 至 2008-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0711961&HistoricalAwards=false
• 关键词: SBIR; Phase; Process; Control; Sensor

This Small Business Innovative Research (SBIR) Phase I research project seeks to develop a real-time, non-invasive sensor for fine particle process control and measurement. This involves two patented innovations, dual detector dynamic light scattering and optical homodyne gain, which will be integrated into a single instrument, or probe, aimed at overcoming critical obstacles to efficient and cost-effective manufacturing. This will advance in-situ monitoring and characterization of fine particles. The goal of this research is to confirm and quantify the joint and/or separate advantages of these two innovative technologies, seeking theoretical insight and empirical closure. The emphasis is focused on especially problematic industrial needs: characterization of high concentration particle suspensions and suspensions with weak scattering signals. Specimens from several industrial and academic collaborators, representing several application areas at the nanoscale (semiconductor polishing, paints, adhesives, fuel cell catalysts, and advanced ceramics) will be studied. The success of this project will enhance the scientific and technological understanding of fine particle behavior, down to the nano length-scale, and will assist in bringing the promise of nanotechnology closer to commercial reality.

该小型企业创新研究（SBIR）第一阶段研究项目旨在开发用于细颗粒过程控制和测量的实时非侵入式传感器。这涉及两项专利创新，双检测器动态光散射和光学零差增益，它们将被集成到一个单一的仪器或探头中，旨在克服高效和具有成本效益的制造的关键障碍。这将促进对细颗粒的原位监测和表征。本研究的目标是确认和量化这两种创新技术的联合和/或单独优势，寻求理论见解和经验总结。重点是集中在特别有问题的工业需求：表征高浓度颗粒悬浮液和悬浮液与弱散射信号。将研究来自几个工业和学术合作者的样品，代表纳米级的几个应用领域（半导体抛光，油漆，粘合剂，燃料电池催化剂和先进陶瓷）。该项目的成功将提高对细颗粒行为的科学和技术理解，直至纳米长度尺度，并将有助于使纳米技术的承诺更接近商业现实。