LEEM and STM Studies of Metal on Semiconductor Growth and Phase Transitions

在分析和表面化学项目的支持下，江教授和她在加州大学戴维斯分校物理系的同事们正在研究薄膜系统中的薄膜生长和二维相变行为。 利用扫描隧道显微镜和低能电子显微镜对Ge（111）表面上金、银薄膜的生长和相变进行了局域和系综研究。 从这些研究中获得的信息基本的金属-半导体结的理解。 实验信息与密度泛函理论和动态低能电子衍射计算相结合。 相变和半导体表面上金属薄膜的成核和生长是分析和表面化学计划支持的研究重点。 蒋教授和她的同事结合联合收割机的实验工具，如扫描探针显微镜与低能电子显微镜检查这些系统，提供有关二维相变的性质和金属半导体结的属性的基本信息。 这些信息对于微电子器件的设计和制造工艺都很重要。

With the support of the Analytical and Surface Chemistry Program, Professor Chiang and her coworkers in the Department of Physics at the University of California-Davis are examining thin film growth and two dimensional phase transition behavior in thin film systems. Using scanning tunneling microscopy coupled with low energy electron microscopy, both local and ensemble studies of the growth and phase transitions of gold and silver thin films on Ge(111) surfaces are carried out. Information fundamental to the understanding of metal-semiconductor junctions is obtained from these studies. Experimental information is coupled with density functional theory and dynamical low energy electron diffraction calculations. Phase transitions and the nucleation and growth of thin metal films on semiconductor surfaces are the focus of the research supported here by the Analytical and Surface Chemistry Program. Professor Chiang and her coworkers combine experimental tools such as scanning probe microscopy with low energy electron microscopy to examine these systems, providing fundamental information about the nature of two dimensional phase transitions and the properties of metal-semiconductor junctions. This information is important for the design of microelectronic devices and the processes to manufacture them.