SBIR Phase I: Development of XRD Based On-Line Characterization of Semicrystalline Plastics

SBIR 第一阶段：开发基于 XRD 的半结晶塑料在线表征

• 批准号: 0740593
• 负责人: Huapeng Huang
• 金额: $ 9.99万
• 依托单位: X-RAY OPTICAL SYSTEMS, INC.
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2008
• 资助国家: 美国
• 起止时间: 2008-01-01 至 2008-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0740593&HistoricalAwards=false
• 关键词: SBIR; Phase; Development; XRD; Based

The Small Business Innovation Research (SBIR) Phase I project will investigate the feasibility for nondestructive, on-line monitoring of critical plastic film crystalline characteristics, including percent crystallinity, crystal size, and crystal orientation. Novel collimated polycapillary x-ray optics coupled with a proprietary x-ray source management system to form a compact, safe, reliable, rugged, low-power X-Beam will be used to carry out x-ray diffraction measurements. Currently there is no practical, nondestructive on-line method to provide this information in real time during the manufacturing process.The behavior and manipulation of semi-crystalline plastics are of great interest to major sectors of the U.S. industry including packaging, automotive, consumer electronics, medical instruments, along with a great variety of aerospace and defense applications. Crystalline information is important for semi-crystalline plastic products because it strongly influences thermal, mechanical, electrical, optical, and chemical resistant properties. The proposed project will focus on high-value, biaxially-oriented films for high-performance plastics electronics applications.

小型企业创新研究(SBIR)第一阶段项目将研究对塑料薄膜的关键结晶特性进行非破坏性在线监测的可行性，包括结晶度百分比、结晶尺寸和结晶取向。新型准直多毛细管X射线光学系统与专有的X射线源管理系统相结合，形成紧凑、安全、可靠、坚固、低功率的X射线束，将用于进行X射线衍射测量。目前还没有实用的、无损的在线方法来在制造过程中实时提供这些信息。半结晶塑料的行为和操作引起了美国工业的主要部门的极大兴趣，包括包装、汽车、消费电子、医疗器械以及各种航空航天和国防应用。结晶信息对半结晶塑料产品非常重要，因为它强烈影响热、机械、电、光学和耐化学性能。拟议的项目将专注于高价值的双向取向薄膜，用于高性能塑料电子应用。