CAREER: An Integrated Approach to Soft Error Mitigation in CMOS Digital Systems

职业生涯： CMOS 数字系统中软错误缓解的综合方法

• 批准号: 0747042
• 负责人: William Robinson
• 金额: $ 40万
• 依托单位: Vanderbilt University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2008
• 资助国家: 美国
• 起止时间: 2008-06-01 至 2013-05-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0747042&HistoricalAwards=false
• 关键词: CAREER; Integrated; Approach; Soft; Error

One of today?s most challenging design issues is the threat of radiation-induced soft errors in CMOS digital systems. In nanometer technologies, the frequency of soft errors affects the markets of consumer electronics and networking, not just aerospace or military applications. This research aims to develop mitigation strategies that reduce the overall soft error rate while minimizing traditional cost metrics such as silicon area, power consumption, and performance degradation. Both technology scaling and system complexity have motivated designers to rely upon cell libraries and reusable cores in their design flow. This work investigates the fundamental fault generation and fault transport of radiation-induced soft errors within those building blocks. By identifying the fundamental characteristics of soft errors, design principles can be developed to improve the starting point for reliability of all types of integrated circuits, from avionics and space applications to enterprise servers, network routers, and control systems. This work includes simulation of irradiated individual circuits as well as experimentation to analyze the full hardware implementation of a microprocessor. The research leverages and integrates traditional domains such as computer architecture, VLSI design, fault tolerance, and radiation effects. Another critical component of this effort is the recruitment and retention of students in science and engineering from traditionally underrepresented groups. The PI has partnered with the Tennessee Louis Stokes Alliance for Minority Participation program at Vanderbilt University to provide summer undergraduate research opportunities and professional development seminars to help students prepare for and succeed in graduate school.

今天的一天？CMOS数字系统中最具挑战性的设计问题是辐射引起的软误差的威胁。在纳米技术中，软错误的频率影响到消费电子和网络市场，而不仅仅是航空航天或军事应用。本研究旨在制定缓解策略，降低整体软错误率，同时最大限度地降低传统成本指标，如硅面积、功耗和性能下降。技术规模和系统复杂性都促使设计师在设计流程中依赖于单元库和可重用核心。这项工作研究了这些构件中辐射诱发软误差的基本断层产生和断层传递。通过识别软错误的基本特征，可以制定设计原则，以提高从航空电子设备和空间应用到企业服务器、网络路由器和控制系统的所有类型集成电路的可靠性起点。这项工作包括辐照单个电路的模拟以及分析微处理器的完整硬件实现的实验。该研究利用并集成了计算机体系结构、超大规模集成电路设计、容错和辐射效应等传统领域。这一努力的另一个关键组成部分是从传统上代表性不足的群体中招收和留住科学和工程专业的学生。PI与范德比尔特大学的田纳西路易斯斯托克斯少数民族参与联盟项目合作，提供夏季本科生研究机会和专业发展研讨会，帮助学生为研究生院做好准备并取得成功。