MRI: Acquisition of a Transmission Electron Microscope for Materials Research and Education

MRI：购买透射电子显微镜用于材料研究和教育

• 批准号: 0922898
• 负责人: Jharna Chaudhuri
• 金额: $ 53.35万
• 依托单位: Texas Tech University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2012-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0922898&HistoricalAwards=false
• 关键词: MRI; Acquisition; Transmission; Electron; Microscope

0922898ChaudhuriTexas Tech U.Technical Abstract: A transmission electron microscope (TEM), in high resolution and with a STEM (scanning transmission electron microscopy) and an EDS (energy dispersive spectroscopy) system, is increasingly becoming an indispensable system to study structural characterization of materials. High resolution TEM imaging and spectroscopic analysis will support research programs in Mechanical, Industrial and Electrical Engineering, Chemistry, Physics, GeoSciences, and Environmental and Human Health including the study of crystallinity and phases in wide band gap semiconductor nano-crystals, atomistic deformation mechanism of nano-crystalline laminates, dislocations in AlGaN quantum dots, crystallographic and morphologic information of metal oxides, size and composition of the nano-alloy catalysts, unique dimensions of nano-energetic materials controlling reaction propagation, nano-scale catalysts, interface of wide band gap semiconductors devices, analysis of carbon nano-tubes, analysis of biodegradable polymer nano-composites, structure and morphology of functionalized nano-particles, reaction mechanisms in rare earth and actinide element-bearing accessory minerals, deposition of metal oxide nano-particles on the surface of fibers, and crystalline defects in B12As2 epitaxial films on SiC substrates. It is expected to bring major scientific and technological breakthroughs through the use of the proposed TEM in all of these studies. The core faculty involved in this project will use this equipment to train graduate and undergraduate students and also to enhance outreach programs to assure the maximum opportunity for training and research by a diverse population of students.Layman Abstract: Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of a photographic film, or to be detected by a sensor such as a CCD camera. TEMs are capable of imaging at a significantly higher resolution than light microscopes, owing to the small de Broglie wavelength of electrons. This enables the instrument to be able to examine fine detail?even as small as a single column of atoms, which is tens of thousands times smaller than the smallest resolvable object in a light microscope. A transmission electron microscope (TEM) is increasingly becoming an indispensable system to study structural characterization of materials at the atomistic level. High resolution TEM imaging and compositional analysis will support research programs in Mechanical, Industrial and Electrical Engineering, Chemistry, Physics, GeoSciences, and Environmental and Human Health including wide band gap semiconductor nano-crystals, nano-crystalline laminates, AlGaN quantum dots, metal oxides, nano-alloy catalysts, nano-energetic materials, nano-scale catalyst materials, wide band gap semiconductors devices, carbon nano-tubes, biodegradable polymer nano-composite plates, functionalized nano-particles, rare earth and actinide element-bearing accessory minerals, nano-fibers, and crystalline defects in B12As2 epitaxial films on SiC substrates. It is expected to bring major scientific and technological breakthroughs through the use of the proposed TEM in all of these studies. The core faculty involved in this project will use this equipment to train graduate and undergraduate students and also to enhance outreach programs to assure the maximum opportunity for training and research by a diverse population of students.

0922898 ChaudhuriTexas Tech U.技术摘要：透射电子显微镜（TEM）具有高分辨率，并具有STEM（扫描透射电子显微镜）和EDS（能量色散谱）系统，正日益成为研究材料结构表征的不可或缺的系统。高分辨率TEM成像和光谱分析将支持机械，工业和电气工程，化学，物理，地球科学以及环境和人类健康的研究计划，包括宽带隙半导体纳米晶体中的结晶度和相的研究，纳米晶体层压体的原子变形机制，AlGaN量子点中的位错，金属氧化物的晶体学和形态学信息，纳米合金催化剂的尺寸和组成、控制反应传播的纳米高能材料的独特尺寸、纳米级催化剂、宽带隙半导体器件的界面、碳纳米管的分析、可生物降解的聚合物纳米复合材料的分析、功能化纳米颗粒的结构和形态、稀土和锕系元素承载辅助矿物中的反应机理，金属氧化物纳米颗粒在纤维表面的沉积，以及SiC衬底上B12 As 2外延膜中的晶体缺陷。预计通过在所有这些研究中使用拟议的TEM，将带来重大的科学和技术突破。参与该项目的核心教师将使用该设备来培训研究生和本科生，并加强推广计划，以确保不同人群的学生的培训和研究的最大机会。Layman摘要：透射电子显微镜（TEM）是一种显微镜技术，其中电子束通过超薄样品传输，与样品相互作用，因为它通过。通过穿过样本的电子相互作用形成图像;图像被放大并聚焦到成像设备（例如荧光屏）上、摄影胶片层上，或由传感器（例如CCD相机）检测。由于电子的布罗意波长很小，TEM能够以比光学显微镜高得多的分辨率成像。这使仪器能够检查细节？甚至小到一列原子，比光学显微镜中最小的可分辨物体小数万倍。透射电子显微镜（TEM）正日益成为在原子水平上研究材料结构表征的不可或缺的系统。高分辨率TEM成像和成分分析将支持机械，工业和电气工程，化学，物理，地球科学以及环境和人类健康的研究计划，包括宽带隙半导体纳米晶体，纳米晶体层压板，AlGaN量子点，金属氧化物，纳米合金催化剂，纳米高能材料，纳米级催化剂材料，宽带隙半导体器件，碳纳米管，可生物降解聚合物纳米复合板、功能化纳米颗粒、稀土和锕系元素辅助矿物、纳米纤维和SiC衬底上B12 As 2外延膜中的晶体缺陷。预计通过在所有这些研究中使用拟议的TEM，将带来重大的科学和技术突破。参与该项目的核心教师将使用这些设备来培训研究生和本科生，并加强推广计划，以确保不同学生群体的培训和研究的最大机会。