Creating and probing graphene based devices using scanning probe microscopy

使用扫描探针显微镜创建和探测基于石墨烯的器件

• 批准号: 0925152
• 负责人: Brian LeRoy
• 金额: $ 29.8万
• 依托单位: University of Arizona
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-09-01 至 2013-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0925152&HistoricalAwards=false
• 关键词: Creating; probing; graphene; based; devices

The objective of this research is to understand the fundamental transport and scattering phenomena in graphene based electronic devices. The approach is to combine scanning probe microscopy and electrical transport measurements to both create and probe the local electronic properties of these devices.Intellectual Merit: Graphene has shown promise to augment silicon in future semiconductor technologies. However, as a gapless semiconductor it is not directly useable in digital electronics. This limitation can be overcome by opening a controlled bandgap by patterning the graphene into narrow strips. This research will explore ways of creating these nanoribbons with atomic control using scanning probe microscopy. Beyond creating these devices, the research will also examine the role of defects, edge roughness, surface morphology and charged impurities on the electronic properties of the nanoribbons. Furthermore, the scanning probe microscopy techniques developed in this proposal may be extended to study other low-dimensional systems.Broader Impacts: This research may lead to entirely new types of electronics devices made from graphene rather than silicon. These devices may significantly extend the capabilities of current semiconductor devices. A concurrent education and outreach program will involve the training of both undergraduate and graduate students and well as outreach to local K-12 schools through the creation of a set of demonstrations based on the research. The outreach to local schools will primarily reach under-represented groups and excite them about nanoscience at a young age.

本研究的目的是了解石墨烯基电子器件中的基本输运和散射现象。该方法是结合联合收割机扫描探针显微镜和电输运测量，以创建和探测这些设备的局部电子特性。知识产权：石墨烯已显示出在未来半导体技术中增加硅的前景。然而，作为一种无间隙半导体，它不能直接用于数字电子产品。这种限制可以通过将石墨烯图案化为窄带来打开受控带隙来克服。这项研究将探索如何创建这些纳米带与原子控制使用扫描探针显微镜。除了创建这些设备之外，该研究还将研究缺陷，边缘粗糙度，表面形态和带电杂质对纳米带电子特性的作用。此外，扫描探针显微镜技术开发的这一建议可能会扩展到研究其他低维system.Broader影响：这项研究可能会导致全新类型的电子设备由石墨烯，而不是硅。这些器件可以显著地扩展当前半导体器件的能力。一个并行的教育和推广计划将涉及本科生和研究生的培训，并通过在研究的基础上创建一套示范来推广到当地的K-12学校。对当地学校的宣传将主要覆盖代表性不足的群体，并在年轻时激发他们对纳米科学的兴趣。