High-resolution probing of nano-scale graphene/metal interfaces for electrochemical applications

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Using nanostructures in design-critical applications requires an understanding of their structure- propertyfunction relationship. The ability to tailor individual components of the structure and an understanding of the impact of the interface on macroscopic properties are key to improve their performance. This project is aimed at improving adhesion and structural stability of novel graphene-based nanocomposite conductors developed by 3M, Canada through structural and functional optimization of their interfaces. Several issues will be addressed in this project: (1) Development of a comprehensive picture of composition, structure and bonding across the interface; (2) Correlation of these samples' adhesion of to their structural details; (3) Determination of chemical and thermal stability of the functional electrode structures and the possibility to functionalize them for improvement of adhesion for electrochemical applications, where strong permanent bonding between individual components of the structure is desired at various conditions. Dr. Goncharova's team will use high-resolution interface and surface probes, such as Rutherford backscattering (RBS), elastic recoil detection analysis (ERDA), X-ray photoemission spectroscopy (XPS), dynamic secondary ion mass spectroscopy (SIMS) and atomic force microscopy (AFM). These results will be compared with the degree of adherence tests, such as mechanical resistance to shear and fracture, as well as interfacial electrical impedance measured with electrochemical impedance spectroscopy (EIS). The project will create new competence for Canadian industry in the very important field of electrical energy storage applications, including Li-ion batteries.