MRI: Acquisition of a State-of-the-Art Aberration-Corrected Analytical Electron Microscope with Enhanced Atomic-Level Spectrometry and Low-Voltage Performance

技术总结：利哈伊大学的研究人员已经获得了JEM-ARM200F像差校正分析电子显微镜（ACAEM），该显微镜配备了冷场发射枪，可以在低加速电压下工作。该仪器具有出色的色谱柱稳定性、改进的电子稳定性、极低的样品漂移，并采用了最新一代的像差校正器。该显微镜还将配备Gatan Quantum能量过滤器和高面积硅漂移检测器（SDD），以便通过电子能量损失光谱法（EELS）和X射线能量色散光谱法（XEDS）以原子分辨率进行常规化学分析。该仪器将提供界面现象的新见解，如金属中的晶界偏析;陶瓷中的界面络合物;铁电体中的畴界;玻璃中的夹杂物和铁电体结构;以及图案化衬底上的半导体外延。在纳米材料领域，该仪器将促进开发用于精细化学品生产、污染物去除和提高汽油辛烷值的新催化剂。此外，将研究新型纳米多孔材料，其应用范围涵盖生物燃料和可再生化学品的生产，以及CO2捕获和透析分离。JEM-ARM200F还将使研究人员能够分析在传统透射电子显微镜中快速破坏的软材料和超束敏感材料（例如聚合物、沸石、含锂化合物、包裹有DNA的碳纳米管）。拟议中的仪器将被安置在电子显微镜用户设施在利哈伊大学是世界著名的电子显微镜的研究，教育，和training. Layman摘要：正如哈勃太空望远镜发现巨大的星系在宇宙的边缘，一个安静的革命在电子显微镜正在发生，提供了一个大大改善了对宇宙的看法。校正电子透镜中存在的像差或扭曲的能力使科学家能够以传统电子显微镜永远无法实现的分辨率收集图像。利哈伊是世界上第一所获得两台像差校正显微镜的大学：一台主要用于原子分辨率成像，另一台用于化学分析。这两种仪器都被充分用于金属、催化剂、陶瓷和半导体的表征;这些研究的结果发表在许多知名期刊上（例如《自然》和《科学》）。尽管这种改进的能力，执行原子分辨率的化学分析仍然是一个斗争。此外，目前的利哈伊显微镜只能在200和300千伏的加速电压下工作，这不适合研究诸如含锂、玻璃、聚合物或生物物质的光束敏感材料。购买最新的JEM-ARM200F像差校正分析电子显微镜，配备可在较低加速电压下操作的场发射枪，以及最先进的电子能量损失和X射线能量色散光谱仪，可以常规进行原子分辨率的化学分析，从而克服了这两个障碍。利哈伊的电子显微镜实验室作为关键的多用户设施和电子显微镜教育和培训中心。通过其世界知名的显微镜学校，利哈伊为来自学术界和工业界以及许多政府实验室的数千名研究科学家和工程师提供服务，所有这些人都将受益于获得最先进的设备。

Technical Summary: Researchers at Lehigh University have acquired a JEM-ARM200F aberration corrected analytical electron microscope (ACAEM), which is equipped with a cold field emission gun and can be operated at low accelerating voltages. This instrument has excellent column stability, improved electronic stability, extremely low sample drift and incorporates the latest generation of aberration corrector. The microscope will also be equipped with a Gatan Quantum energy filter and a high area silicon drift detector (SDD) to routinely allow chemical analysis by electron energy-loss spectrometry (EELS) and X-ray energy dispersive spectrometry (XEDS) at atomic resolution. The instrument will offer new insights into interfacial phenomena such as grain boundary segregation in metals; interfacial complexions in ceramics; domain boundaries in ferroelectrics; inclusions and ferroelectric architecture in glass; and the epitaxy of semiconductors on patterned substrates. In the realm of nanomaterials, the instrument will facilitate the development of new catalysts for fine chemical production, pollutant removal, and upgrading the octane rating of gasoline. In addition, novel types of nanoporous materials will be studied that have applications spanning the production of bio-fuels and renewable chemicals, to CO2 capture and dialysis separations. The JEM-ARM200F will also give researchers the capacity to analyze soft and ultra-beam sensitive materials (e.g. polymers, zeolites, compounds containing lithium, carbon nanotubes wrapped with DNA) that are quickly destroyed in conventional transmission electron microscopes. The proposed instrument will be housed within the electron microscopy user facility at Lehigh University which is world-renowned for its electron microscopy research, education, and training.Layman Summary: Just as the Hubble space telescope was discovering giant galaxies at the edge of the universe, a quiet revolution in electron microscopy was taking place that offered a much improved view of the nanoworld. The ability to correct the aberrations, or distortions, that exist in electron lenses has enabled scientists to collect images with a resolution that could never have been achieved with conventional electron microscopes. Lehigh was the first university in the world to acquire two aberration corrected microscopes: one primarily dedicated to atomic resolution imaging, and the other optimized for chemical analysis. Both instruments have been fully utilized for the characterization of metals, catalysts, ceramics and semiconductors; the results of these studies have appeared in many high profile journals (e.g. in Nature and Science). Despite this improved capability, performing chemical analysis with atomic resolution is still a struggle. In addition, the current Lehigh microscopes only work at accelerating voltages of 200 and 300kV which is not suitable for the study of beam sensitive materials such as those containing lithium, glass, polymer, or biological matter. Both of these obstacles are overcome with the purchase of the latest JEM-ARM200F aberration corrected analytical electron microscope equipped with a field emission gun that can be operated at lower accelerating voltages, and state-of-the-art electron energy loss and X-ray energy dispersive spectrometers enabling chemical analysis with atomic resolution to be performed on a routine basis. Lehigh's electron microscopy laboratory acts as key multi-user facility and a center for electron microscopy education and training. Through its world-renowned microscopy schools, Lehigh serves thousands of research scientists and engineers from academia and industry as well as many government laboratories, all of whom will benefit from having access to state-of-the-art equipment.