MRI: Acquisition of a State-of-the-Art Aberration-Corrected Analytical Electron Microscope with Enhanced Atomic-Level Spectrometry and Low-Voltage Performance

MRI：购买具有增强原子级光谱测定和低电压性能的最先进的像差校正分析电子显微镜

• 批准号: 1040229
• 负责人: Masashi Watanabe
• 金额: $ 129.6万
• 依托单位: Lehigh University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-10-01 至 2013-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1040229&HistoricalAwards=false
• 关键词: MRI; Acquisition; State; Art; Aberration

Technical Summary: Researchers at Lehigh University have acquired a JEM-ARM200F aberration corrected analytical electron microscope (ACAEM), which is equipped with a cold field emission gun and can be operated at low accelerating voltages. This instrument has excellent column stability, improved electronic stability, extremely low sample drift and incorporates the latest generation of aberration corrector. The microscope will also be equipped with a Gatan Quantum energy filter and a high area silicon drift detector (SDD) to routinely allow chemical analysis by electron energy-loss spectrometry (EELS) and X-ray energy dispersive spectrometry (XEDS) at atomic resolution. The instrument will offer new insights into interfacial phenomena such as grain boundary segregation in metals; interfacial complexions in ceramics; domain boundaries in ferroelectrics; inclusions and ferroelectric architecture in glass; and the epitaxy of semiconductors on patterned substrates. In the realm of nanomaterials, the instrument will facilitate the development of new catalysts for fine chemical production, pollutant removal, and upgrading the octane rating of gasoline. In addition, novel types of nanoporous materials will be studied that have applications spanning the production of bio-fuels and renewable chemicals, to CO2 capture and dialysis separations. The JEM-ARM200F will also give researchers the capacity to analyze soft and ultra-beam sensitive materials (e.g. polymers, zeolites, compounds containing lithium, carbon nanotubes wrapped with DNA) that are quickly destroyed in conventional transmission electron microscopes. The proposed instrument will be housed within the electron microscopy user facility at Lehigh University which is world-renowned for its electron microscopy research, education, and training.Layman Summary: Just as the Hubble space telescope was discovering giant galaxies at the edge of the universe, a quiet revolution in electron microscopy was taking place that offered a much improved view of the nanoworld. The ability to correct the aberrations, or distortions, that exist in electron lenses has enabled scientists to collect images with a resolution that could never have been achieved with conventional electron microscopes. Lehigh was the first university in the world to acquire two aberration corrected microscopes: one primarily dedicated to atomic resolution imaging, and the other optimized for chemical analysis. Both instruments have been fully utilized for the characterization of metals, catalysts, ceramics and semiconductors; the results of these studies have appeared in many high profile journals (e.g. in Nature and Science). Despite this improved capability, performing chemical analysis with atomic resolution is still a struggle. In addition, the current Lehigh microscopes only work at accelerating voltages of 200 and 300kV which is not suitable for the study of beam sensitive materials such as those containing lithium, glass, polymer, or biological matter. Both of these obstacles are overcome with the purchase of the latest JEM-ARM200F aberration corrected analytical electron microscope equipped with a field emission gun that can be operated at lower accelerating voltages, and state-of-the-art electron energy loss and X-ray energy dispersive spectrometers enabling chemical analysis with atomic resolution to be performed on a routine basis. Lehigh's electron microscopy laboratory acts as key multi-user facility and a center for electron microscopy education and training. Through its world-renowned microscopy schools, Lehigh serves thousands of research scientists and engineers from academia and industry as well as many government laboratories, all of whom will benefit from having access to state-of-the-art equipment.

技术概述：美国理哈伊大学的研究人员获得了一台JEM-ARM200F像差校正分析电子显微镜（ACAEM），该显微镜配备了冷场发射枪，可以在低加速电压下工作。该仪器具有优异的柱稳定性，改进的电子稳定性，极低的样品漂移，并结合了最新一代的像差校正器。该显微镜还将配备Gatan量子能量过滤器和高面积硅漂移探测器（SDD），以常规方式进行原子分辨率的电子能量损失光谱（EELS）和x射线能量色散光谱（XEDS）的化学分析。该仪器将为金属的晶界偏析等界面现象提供新的见解；陶瓷中的界面络合；铁电体的畴边界；玻璃中的夹杂物和铁电结构；以及半导体在图案衬底上的外延。在纳米材料领域，该仪器将有助于开发用于精细化工生产、污染物去除和提高汽油辛烷值的新型催化剂。此外，新型纳米多孔材料将被研究，其应用范围涵盖生物燃料和可再生化学品的生产，二氧化碳捕获和透析分离。JEM-ARM200F还将使研究人员能够分析软材料和超光束敏感材料（例如聚合物、沸石、含锂化合物、包裹着DNA的碳纳米管），这些材料在传统的透射电子显微镜中很快就会被破坏。拟议的仪器将被安置在里海大学的电子显微镜用户设施内，该设施以其电子显微镜研究，教育和培训而闻名。概要：就在哈勃太空望远镜发现宇宙边缘的巨大星系时，电子显微镜领域的一场悄无声息的革命正在发生，它为纳米世界提供了更好的视角。纠正电子透镜中存在的像差或畸变的能力使科学家能够以传统电子显微镜无法达到的分辨率收集图像。里海大学是世界上第一所拥有两台像差校正显微镜的大学：一台主要用于原子分辨率成像，另一台用于化学分析。这两种仪器已被充分用于金属、催化剂、陶瓷和半导体的表征；这些研究的结果发表在许多知名期刊上（例如《自然》和《科学》）。尽管有了这种改进的能力，用原子分辨率进行化学分析仍然是一个难题。此外，目前的利哈伊显微镜只能在200和300kV的加速电压下工作，不适合研究含有锂、玻璃、聚合物或生物物质的光束敏感材料。这两个障碍都可以通过购买最新的JEM-ARM200F像差校正分析电子显微镜来克服，该显微镜配备了可以在较低加速电压下操作的场发射枪，以及最先进的电子能量损失和x射线能量色散光谱仪，使原子分辨率的化学分析能够在常规基础上进行。利哈伊大学的电子显微镜实验室是重要的多用户设施和电子显微镜教育和培训中心。通过其世界著名的显微镜学校，里海为来自学术界和工业界以及许多政府实验室的数千名研究科学家和工程师提供服务，他们都将受益于获得最先进的设备。