Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems, July 8-9, 2010 Arlington, VA

混合信号电路和系统中的故障和不确定性研讨会，2010 年 7 月 8-9 日，弗吉尼亚州阿灵顿

• 批准号: 1040712
• 负责人: Ralph Cavin
• 金额: $ 4.96万
• 依托单位: Semiconductor Research Corporation
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-06-01 至 2011-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1040712&HistoricalAwards=false
• 关键词: Workshop; Failure; Uncertainty; Mixed; Signal

The objective of this workshop is to explore and identify the critical research challenges in the area of the design of failure-resistant electronic mixed-signal circuits and systems. This area is of interest to insure sustained and increased reliability in health-related, transportation, high performance computing, and self-sustainable energy systems. One cause of reduced reliability is the increasing probability of device failure as feature sizes of integrated circuits are reduced. However, with the increased presence of analog circuits and components as parts of systems as well as the increased 3-D integration density, other reliability concerns arise. Besides the problem of reduced device reliability and increased parameter uncertainty, the complicated coupling between densely integrated components, circuits, packaging and sub-systems is often too complex to be fully considered in the design. Failure of such systems is not of the traditional pass/fail nature and might be caused by either design errors (or poor designs) or operational conditions. Instead, for mixed-signal components as well as for systems at the application level, there is more concern with graceful degradation, recovery from transient and permanent errors, and robust behavior at the system level. This suggests that an integrated approach incorporating all levels of the design hierarchy is necessary to provide reliability to the system user. This workshop will bring together a select group of experts in the relevant fields of mixed-signal circuit and system design, simulation, and testing. The workshop will assess research needs for ensuring resistance to failure in safety-critical areas including medical, transportation, and aerospace applications.

该研讨会的目的是探索和确定在耐故障电子混合信号电路和系统设计领域的关键研究挑战。这一领域对确保与健康相关的、交通运输、高性能计算和自我可持续能源系统的持续和提高的可靠性是有意义的。可靠性降低的一个原因是随着集成电路的特征尺寸减小，器件故障的概率增加。然而，随着作为系统组成部分的模拟电路和组件的出现以及3-D集成密度的增加，出现了其他的可靠性问题。除了器件可靠性降低和参数不确定性增加的问题外，密集集成的元件、电路、封装和子系统之间的复杂耦合往往过于复杂，无法在设计中充分考虑。此类系统的故障不属于传统的通过/不通过性质，可能是由设计错误(或糟糕的设计)或操作条件引起的。相反，对于混合信号组件以及应用程序级别的系统，更关注的是优雅降级、从瞬时和永久错误中恢复以及系统级别的健壮行为。这表明，为了向系统用户提供可靠性，需要一种综合的方法，该方法包含了设计层次的所有级别。本次研讨会将汇集一批在混合信号电路和系统设计、仿真和测试相关领域的专家。研讨会将评估在包括医疗、运输和航空航天应用在内的安全关键领域中确保抗故障能力的研究需求。