Planning Grant: I/UCRC for Integrated Design-for-Reliability for Electronics

规划补助金：I/UCRC 电子产品可靠性集成设计

• 批准号: 1160870
• 负责人: Bharat Bhuva
• 金额: $ 1.15万
• 依托单位: Vanderbilt University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-02-01 至 2013-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1160870&HistoricalAwards=false
• 关键词: Planning; Grant; UCRC; Integrated; Design

I/UCRC for Integrated Design-for-Reliability for Electronics (iDRE) 1160865 University of California-Riverside; Albert Wang 1160870 Vanderbilt University; Bharat Bhuva The University of California-Riverside (UC-R) and Vanderbilt University (VU) are collaborating to establish the proposed center, with UC-R as the lead institution. The Center for Integrated Design-for-Reliability for Electronics (iDRE) will conduct research on investigating radiation and transient electrostatic discharge (ESD) induced failures to integrated circuits (IC), multi-chip nodules (MCM) and system-in-package (SiP), and microelectronics systems; as well as developing reliability solutions by integrated designs for industrial electronics. An additional objective of the planning grant proposal is to hold a meeting with potential industrial partners to discuss the research needs for integrated design-for-reliability (DfR) and center operation mechanisms. If successful, research activities at the iDRE Center will reveal fundamentals and mechanisms of ESD and soft error failures, as well as deliver ESD protection and soft error mitigation solutions to advanced ICs and systems. The research outcomes will cast huge impacts on modern microelectronics and system products, and will have significant benefits to the electronic industry and the nation's economy. The proposed integrated DfR reliability solutions will affect all aspects of human lives, from communications and entertainment, to information processing and storage, to life-threatening devices and mission-critical tasks, and so on. The PIs also propose a diversity plan to promote involvement of female and underrepresented minority students in engineering education and research.

电子产品可靠性集成设计研究所(IDRE)1160865加州大学河滨分校；阿尔伯特·王1160870范德比尔特大学；巴拉特·布瓦加州大学河滨分校(UC-R)和范德比尔特大学(VU)正在合作建立拟议的中心，加州大学河滨分校(UC-R)是牵头机构。电子集成可靠性设计中心(IDRE)将进行研究，调查集成电路(IC)、多芯片结节(MCM)和系统级封装(SiP)以及微电子系统的辐射和瞬时静电放电(ESD)引起的故障；以及通过工业电子的集成设计开发可靠性解决方案。规划拨款提案的另一个目标是与潜在的工业合作伙伴举行会议，讨论综合可靠性设计(DFR)和中心运营机制的研究需求。如果成功，iDRE中心的研究活动将揭示ESD和软错误故障的基本原理和机制，并为先进的IC和系统提供ESD保护和软错误缓解解决方案。研究成果将对现代微电子和系统产品产生巨大影响，并将对电子产业和国家经济产生重大效益。拟议的集成DFR可靠性解决方案将影响人类生活的方方面面，从通信和娱乐，到信息处理和存储，再到危及生命的设备和关键任务，等等。私人投资机构还提出了一项多元化计划，以促进女性和代表性不足的少数族裔学生参与工程教育和研究。