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SBIR Phase I: A Novel Electroless Nickel/Immersion Gold (ENIG) Surface Finish for Better Reliability of Electronic Assemblies

SBIR Phase I: A Novel Electroless Nickel/Immersion Gold (ENIG) Surface Finish for Better Reliability of Electronic Assemblies
SBIR 第一阶段:新型化学镀镍/沉金 (ENIG) 表面处理,可提高电子组件的可靠性
批准号:
1621067
负责人:
Kunal Shah
金额:
$22.5万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2016
资助国家:
美国
项目状态:
已结题
起止时间:
2016-07-01 至 2017-06-30

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中文摘要
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英文摘要
This Small Business Innovation Research Phase I project will develop a cost-effective novel Electroless Nickel Immersion Gold (ENIG) surface finish to achieve robust solder joints for better reliability of electronic assemblies. Currently available ENIG surface finishes are prone to so-called "black pads", which are sites of galvanic hyper corrosion that lead to failures associated with de-wetting of solder, brittle solder joints, component disconnection, and overall malfunction of electronic assemblies. Existing substitute surface finishes are either very expensive or do not resolve the black pad defects fully, and they can compromise other key properties. The cost-effective novel ENIG to be developed will eliminate black pads, corrosion related issues, achieve robust solder joints and provide improved quality & reliability of electronic assembly products to end consumers. This will allow manufacturers to avoid major product field failures and the resulting consequences. This new technology would be a potential replacement for existing ENIG (with a market value in excess of $400 million) and other surface finishes (representing a market exceeding $1 billion).The intellectual merit of this project includes development of a cost-effective novel ENIG to eliminate black pads and achieve robust solder joints. The root cause of black pad defects has been identified as hyper corrosion activity of the immersion gold process which originates at intergranular boundaries and crevices of the nickel-phosphorous surface. Galvanic hyper-corrosion occurs between gold and nickel atoms, resulting in nickel depletion and an enrichment of phosphorous atoms in the localized area. The proposed research would use an interfacial engineering approach at the gold and nickel-phosphorous interfaces to prevent black pads and eliminate brittle solder failures in the electronic assemblies. The main objective of the proposed Phase I research is to achieve marked improvement in corrosion resistance (eliminate black pads) and attain robust solder joints (eliminate brittle solder joint failures). This will involve identifying right interfacial chemistry and process parameters. Corrosion resistance of this new process will be evaluated using electrochemical corrosion tests and acid tests. In addition, solder joint strength and properties (brittle/ductile) will be investigated using ball shear tests and cold ball pull tests.
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SBIR Phase II: A Novel Electroless Nickel/Immersion Gold (ENIG) Surface Finish for Better Reliability of Electronic Assemblies
  • 批准号:
    1739047
  • 项目类别:
    Standard Grant
  • 资助金额:
    $75.0万
  • 财政年份:
    2017
  • 负责人:
    Kunal Shah
  • 依托单位:
国内基金
海外基金
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  • 项目类别:
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  • 资助金额:
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  • 批准号:
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  • 项目类别:
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  • 资助金额:
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  • 批准年份:
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  • 负责人:
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  • 批准号:
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  • 项目类别:
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  • 资助金额:
    12.0万元
  • 批准年份:
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  • 负责人:
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  • 依托单位:
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