PIXEL2020: The 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging

该奖项支持将于2020年12月14日至18日在新墨西哥州圣达菲举行的第10届粒子和成像半导体像素探测器国际研讨会（PIXEL 2020）。 本次研讨会将推进在天体物理和空间应用中，在核、重离子和宇宙学背景下，在同步加速器光和轻子束中，以及在各种需要辐射硬化材料的健康、通信和国防应用中，能够发现最高能量、最稀有过程的技术。本次研讨会将回顾现有的和拟议的粒子物理和X射线成像像素探测器。 将讨论的问题包括新的设计和架构，辐射效应，仿真，对准和校准，机械稳定性和冷却，电子读出和前端ASIC，以及触发。 该奖项支持多达25名参与研究生和初级研究人员的出席。由于所有会议都是全体会议，这次会议将为这些年轻科学家提供极好的接触机会。会议记录将提供给全世界的仪器界使用。本次研讨会将带来西南国际仪器专家。该奖项反映了NSF的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。

This award supports the 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging (PIXEL2020), to be held in Santa Fe, New Mexico on December 14-18, 2020. This workshop will advance technologies that enable discoveries at the highest energies, of the rarest processes, in astrophysical and space applications; in nuclear, heavy ion, and cosmology contexts; in synchrotron light and lepton beams; and in a variety of health, communications, and defense applications requiring radiation hardened materials.This workshop will review existing and proposed pixel detectors for particle physics and for x-ray imaging. Issues to be discussed include new designs and architectures, radiation effects, simulation, alignment and calibration, mechanical stability and cooling, electronic readout and front-end ASICs, and triggering. This award supports the attendance of up to 25 participating graduate students and junior investigators. As all sessions will be plenary, this meeting will provide excellent exposure for these junior scientists. Proceedings will be made available for the use of the worldwide instrumentation community. This workshop will bring to the Southwest international experts on instrumentation. Developments will have potential applications to medicine, astrophysics, biology, and nuclear and particle physics.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.