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MRI: Acquisition of X-Ray Diffraction System

MRI: Acquisition of X-Ray Diffraction System
MRI:X 射线衍射系统的采集
批准号:
2215247
负责人:
Wilfredo Otano
金额:
$30.41万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2022
资助国家:
美国
项目状态:
已结题
起止时间:
2022-09-01 至 2023-08-31

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中文摘要
翻译
这项主要研究仪器(MRI)计划资助支持收购最先进的X射线衍射系统(XRD),以推进物理,化学,材料科学和工程方面的研究和教育活动。位于该岛东南部的波多黎各大学卡伊校区为全岛的教师和学生提供XRD系统。XRD系统使超过九个研究小组能够使用衍射技术推进他们的研究项目,这些技术只有在这个设施中才能使用。主要用户包括来自波多黎各大学Mayaguez校区的教师和Ana G.门德斯大学,而来自UPR Ponce,Río Piedras和Humacao校区的研究人员也作为次要用户受益。 该项目促进不同研究小组之间的合作,对教师和学生的培训以及教育活动。 为参与研究或参加课程的本科生提供培训和研讨会,包括使用该仪器。获得的高分辨率X射线衍射系统是表征薄膜,纳米结构和低衍射材料结晶度的理想选择。 平行光束光学器件、通道切割单色仪和测角仪的三轴测量能力相结合,可以实现高分辨率测量。添加区域检测器允许研究晶体取向,不仅改善针对特定晶相获得的信息,而且提供关于晶体织构、缺陷和晶体尺寸等的信息。该仪器能够研究纳米颗粒、多层膜和具有纳米形态的薄膜。此外,高温加热附件和纹理,应力和Rietveld插件提供了先进的技术,如倒易空间映射,摇摆曲线和极图测量。 受益于该仪器的项目包括多铁性隧道结的研究、用于表面增强拉曼光谱的银纳米颗粒的表征、用于感测十亿分之一范围内的有害气体的氧化锌的研究、掺杂GaN中的缺陷的调查、以及XRD系统在综合本科实验室实验中的使用,包括不同物理和化学子系统的主题,学科和各种仪器技术。该项目由NSF综合活动办公室(OIA)联合资助,激励竞争研究计划(EPSCoR)该奖项反映了NSF的法定使命,并通过使用基金会的知识价值和更广泛的影响审查进行评估,被认为值得支持的搜索.
英文摘要
This Major Research Instrumentation (MRI) program grant supports the acquisition of a state-of-the-art X-Ray Diffraction System (XRD) to advance research and educational activities in physics, chemistry, materials science, and engineering. Located in the southeast of the island, the Cayey campus of the University of Puerto Rico provides access to the XRD system to faculty and students from across the island. The XRD system enables over nine research groups to advance their research projects using diffraction techniques which are only available at this facility. Primary users include faculty from the University of Puerto Rico in the Mayaguez Campus, and the Ana G. Mendez University while researchers from UPR Ponce, Río Piedras, and Humacao campus also benefit as secondary users. The project promotes collaboration between different research groups, training for faculty and students, and educational activities. Training and workshops are offered to undergraduate students participating in research or taking courses that include the use of this instrumentation.The obtained high-resolution X-Ray diffraction system is ideal for the characterization of crystallinity in thin films, nanostructures, and low diffracting materials. The combination of the parallel beam optics, a channel-cut monochromator, and the goniometer’s triple-axis measurement capacity, allows for high-resolution measurements. The addition of an area detector allows for the study of crystal orientations, not only improving the information obtained for a particular crystal phase, but also providing information on the crystalline texture, defects, and crystalline size amongst others. This instrument enables the study of nanoparticles, multilayers, and thin films with nanometric morphologies. Furthermore, the high-temperature heating attachment and the texture, stress, and Rietveld plugins provide advanced techniques such as reciprocal space mapping, rocking curve, and pole figures measurements. Projects that benefit from this instrument include studies of multiferroic tunnel junctions, characterization of silver nanoparticles for surface-enhanced Raman spectroscopy, studies of zinc oxide for sensing harmful gases in the parts per billion range, investigations of defects in doped GaN, and the use of the XRD system in integrated undergraduate laboratory experiments including topics from different physics and chemistry sub-disciplines and a variety of instrumental techniques.This project is jointly funded by the NSF Office of Integrated Activities (OIA), and the Established Program to Stimulate Competitive Research (EPSCoR).This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
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Aquisition of a Scanning Electron Microscope for Materials Research and Education
  • 批准号:
    0315632
  • 项目类别:
    Standard Grant
  • 资助金额:
    $26.2万
  • 财政年份:
    2003
  • 负责人:
    Wilfredo Otano
  • 依托单位:
海外基金