MRI: Acquisition of an X-Ray Photoelectron Spectrometer (XPS) for Materials Related Research and Education at Boston University

该奖项由主要研究仪器和化学研究仪器项目联合支持。波士顿大学正在获得具有低能逆光电子能谱、紫外光电子能谱和拉曼能谱能力的x射线光电子能谱仪（XPS），以支持Xi Ling教授及其同事Keith Brown、Malika Jeffries-EL和Kevin Smith的研究。该仪器促进了化学、工程和物理领域的研究。XPS光谱是通过用足够能量的x射线照射样品以射出电子而产生的，并且测量电子的动能并随后与它们的结合能相关。这些数据可能与样品中的化学元素以及它们的结合环境有关。该仪器提高了许多部门学生的教育、研究和教学努力，并为附近的机构提供了可访问性。来自不同背景的学生在他们的研究和研究训练中使用仪器。通过与两门课程的整合，增强了可访问性。该奖项旨在加强各个层面的研究和教育，特别是在功能材料和结构等领域。这包括研究二维材料和异质结构的电子能带结构，以及与太阳能技术相关的有机半导体分子的光电特性。此外，XPS还用于确定低维相关固体的电子结构，以了解其光学、电学、磁性、结构和化学性质。它还用于探测纳米结构聚合物表面的表面化学和动力学。该奖项反映了美国国家科学基金会的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。

This award is jointly supported by the Major Research Instrumentation and the Chemistry Research Instrumentation Programs. Boston University is acquiring X-ray photoelectron spectrometer (XPS) with low-energy inverse photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and Raman spectroscopy capabilities to support the research of Professor Xi Ling and colleagues Keith Brown, Malika Jeffries-EL, and Kevin Smith. The instrument facilitates research in the areas of chemistry, engineering, and physics. XPS spectra are produced by irradiating a specimen with X-rays with sufficient energy to eject electrons, and the kinetic energy of the electrons is measured and subsequently related to their binding energy. These data can be related to the chemical elements in the sample as well as to their bonding environment. This instrument enhances the educational, research, and teaching efforts of students in many departments as well as provides accessibility for use at nearby institutions. Students from diverse backgrounds utilize the instrument in their research and research training. Accessibility is enhanced through its integration in two courses.The award for the XPS is aimed at enhancing research and education at all levels, especially in areas such as functional materials and structures. This includes investigations of the electronic band structure of two dimensional materials and heterostructures as well as the optoelectric properties of organic semiconducting molecules relevant to solar technology. In addition, XPS is used to determine the electronic structure of low dimensional correlated solids to understand their optical, electrical, magnetic, structural, and chemical properties. It is also used to probe the surface chemistry and dynamics of nanostructured polymer surfaces.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.