MRI: Acquisition of an X-Ray Photoelectron Spectrometer (XPS) for Materials Related Research and Education at Boston University

该奖项由主要研究仪器项目和化学研究仪器项目共同支持。波士顿大学正在获取具有低能反向光电子能谱、紫外光电子能谱和拉曼光谱能力的X射线光电子能谱仪(XPS)，以支持席玲教授及其同事基思·布朗、马利卡·杰弗里斯-埃尔和凯文·史密斯的研究。该仪器促进了化学、工程和物理领域的研究。XPS光谱是通过用足够能量射出电子的X射线照射样品而产生的，测量了电子的动能，随后与它们的结合能有关。这些数据可能与样品中的化学元素以及它们的键合环境有关。这一工具加强了许多系学生的教育、研究和教学努力，并提供了在附近机构使用的便利条件。来自不同背景的学生在他们的研究和研究培训中使用该仪器。通过两门课程的整合提高了可及性。XPS奖旨在加强各级的研究和教育，特别是在功能材料和结构等领域。这包括研究二维材料的电子能带结构和异质结构，以及与太阳能技术有关的有机半导体分子的光电性质。此外，XPS还用于确定低维相关固体的电子结构，以了解它们的光学、电学、磁学、结构和化学性质。该奖项也被用于探索纳米结构聚合物表面的表面化学和动力学。该奖项反映了NSF的法定使命，并通过使用基金会的智力优势和更广泛的影响审查标准进行评估，被认为值得支持。

This award is jointly supported by the Major Research Instrumentation and the Chemistry Research Instrumentation Programs. Boston University is acquiring X-ray photoelectron spectrometer (XPS) with low-energy inverse photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and Raman spectroscopy capabilities to support the research of Professor Xi Ling and colleagues Keith Brown, Malika Jeffries-EL, and Kevin Smith. The instrument facilitates research in the areas of chemistry, engineering, and physics. XPS spectra are produced by irradiating a specimen with X-rays with sufficient energy to eject electrons, and the kinetic energy of the electrons is measured and subsequently related to their binding energy. These data can be related to the chemical elements in the sample as well as to their bonding environment. This instrument enhances the educational, research, and teaching efforts of students in many departments as well as provides accessibility for use at nearby institutions. Students from diverse backgrounds utilize the instrument in their research and research training. Accessibility is enhanced through its integration in two courses.The award for the XPS is aimed at enhancing research and education at all levels, especially in areas such as functional materials and structures. This includes investigations of the electronic band structure of two dimensional materials and heterostructures as well as the optoelectric properties of organic semiconducting molecules relevant to solar technology. In addition, XPS is used to determine the electronic structure of low dimensional correlated solids to understand their optical, electrical, magnetic, structural, and chemical properties. It is also used to probe the surface chemistry and dynamics of nanostructured polymer surfaces.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.