Three-Dimensional Modelling of X-Ray Emission in Electron Probe Microanalysis Based on Deterministic Transport Equations
基于确定性输运方程的电子探针显微分析中 X 射线发射的三维建模
基本信息
- 批准号:275207500
- 负责人:
- 金额:--
- 依托单位:
- 依托单位国家:德国
- 项目类别:Research Grants
- 财政年份:2015
- 资助国家:德国
- 起止时间:2014-12-31 至 2020-12-31
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
The investigation of material properties and the development of new materials heavily rely on the characterization of their microstructure. A critical aspect of the characterization is to measure the distribution of the different chemical elements present inside a material. A well-established characterization technique is the electron probe microanalysis (EPMA), in which an electron beam interacts with the material causing the emission of x-rays characteristic to the local composition. This technique has the unique advantage to provide accurate quantitative information about the composition of a sample at the micrometer to nanometer scale, while allowing the investigation of a macroscopic sampling area. Although successful, this method is based on the assumption that the sample is homogeneous within the interaction volume of the electron beam, hence the structures of interest must be bigger than the interaction volume in order to be analyzed.Therefore, to apply the quantification procedures to even smaller scales it is necessary to derive fast and accurate mathematical and numerical models of electron-x-ray-matter interactions in complex geometries. In this project the usual approaches by simple analytical models or expensive Monte-Carlo simulations will be replaced by the description of electron scattering as a continuous process following the Boltzmann transport equation. The high dimensionality of the Boltzmann equation can be reduced by moment approximations and a closure procedure based on the maximum-entropy principle. The reduced model is given by a partial differential equation and will be solved numerically by a finite volume method in order to provide a fast and accurate prediction of the electron energy distribution inside a material. The resulting numerical software will be carefully validated against existing analytical models, standardized samples and Monte-Carlo simulations.
材料性能的研究和新材料的开发在很大程度上依赖于其微观结构的表征。表征的一个关键方面是测量存在于材料内部的不同化学元素的分布。一种成熟的表征技术是电子探针微分析(EPMA),其中电子束与材料相互作用,导致局部成分的x射线特征发射。该技术具有独特的优势,可以在微米到纳米尺度上提供关于样品组成的准确定量信息,同时允许对宏观采样区域进行调查。虽然这种方法是成功的,但它是建立在假设样品在电子束的相互作用体积内是均匀的基础上的,因此,为了进行分析,感兴趣的结构必须大于相互作用体积。因此,为了将量化过程应用于更小的尺度,有必要推导出复杂几何结构中电子-x射线-物质相互作用的快速准确的数学和数值模型。在这个项目中,通常采用简单的分析模型或昂贵的蒙特卡罗模拟的方法将被描述电子散射作为跟随玻尔兹曼输运方程的连续过程所取代。玻尔兹曼方程的高维可以通过矩近似和基于最大熵原理的闭包过程来降低。简化模型由偏微分方程给出,并采用有限体积法进行数值求解,以便快速准确地预测材料内部的电子能量分布。所得到的数值软件将针对现有的分析模型、标准化样本和蒙特卡罗模拟进行仔细验证。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Dr. Silvia Richter其他文献
Dr. Silvia Richter的其他文献
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{{ truncateString('Dr. Silvia Richter', 18)}}的其他基金
Subscale Inversion of X-Ray Emission in Electron Probe Microanalysis Based on Deterministic Transport Equations
基于确定性输运方程的电子探针显微分析中X射线发射的亚尺度反演
- 批准号:
466010736 - 财政年份:
- 资助金额:
-- - 项目类别:
Research Grants
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