Computertomographic investigation and FE simulation of the impact of manufacturing process parameters and service conditions on the microstructure and the properties of selected material systems

计算机断层扫描研究和有限元模拟，研究制造工艺参数和使用条件对所选材料系统的微观结构和性能的影响

• 批准号: 316930056
• 负责人: Professor Dr.-Ing. Wolfgang Tillmann
• 金额: --
• 依托单位: Informatik VII - Lehrstuhl für Computergraphik
• 依托单位国家: 德国
• 项目类别: Major Instrumentation Initiatives
• 财政年份: 2016
• 资助国家: 德国
• 起止时间: 2015-12-31 至 2019-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/316930056?language=en
• 关键词: Computertomographic; investigation; FE; simulation; impact

In this proposal, an X-ray tomographic microscope (XTM) is applied for, which is suitable to conduct special microtomographic analysis techniques with a microfocus X-ray tube. With the new XTM, the restrictions of the µCT scanning systems which exist at TU Dortmund and which only exploit the direct geometric magnification will be circumvented. One of the key advantages of the requested XTM lies in the fact that true spatial resolution down to submicron scale can be maintained at large distances of the specimen to the X-ray source. A further key advantage is that additional information about the specimen can be obtained by elaborate imaging techniques such as phase contrast tomography, dual energy tomography or diffraction contrast tomography. With this high performance XTM, different research topics will be addressed:- Materials development and engineering: Impact of the manufacturing on the microstructure and the mechanical behavior of AM- and PM-fabricated materials, particle- and fiber-reinforced metal and plastic matrix composites and thermally sprayed coatings- Production engineering: Influence of metal engineering and machining of materials on the microstructure; Effect of local properties in filtering systems on the deposition of particles- Biomedical engineering: Effect of surface structuring, chemical modification and curvature on biofilm growth and FE simulations of blood flow in vascular systems to predict the rupture of aneurysms and to optimize stent and coil geometriesIn the above mentioned research fields the XTM will be used to acquire 3D images of the material systems with highest spatial and contrast resolution. Miscellaneous in situ experiments are planned for which test rigs will be designed and built. Thereby, the applicants will record and analyze microstructural changes on the (sub)micrometer level which are caused by processing or by mechanical, corrosive, erosive or thermal load. Using the proposed connection of between experiments and multiscale simulations based on tomographic images an essential gain of knowledge will be achieved in the itemized research fields. Additionally, the combination of the tomographically collected high resolution 3D data with the results of complementary imaging techniques (e.g. SEM with EDX, EBSD) will be a key element to deduce the understanding of the observed phenomena and effects.

在这个建议中，X射线层析显微镜（XTM）的应用，这是适合进行特殊的显微层析分析技术与微焦点X射线管。借助新的XTM，多特蒙德工业大学现有的仅利用直接几何放大的µCT扫描系统的限制将被规避。所要求的XTM的关键优势之一在于，真正的空间分辨率下降到亚微米级的事实，可以保持在大距离的样品的X射线源。另一个关键的优点是，关于标本的附加信息可以通过复杂的成像技术，如相位衬度断层扫描，双能量断层扫描或衍射衬度断层扫描获得。有了这个高性能的XTM，不同的研究课题将得到解决： 材料开发和工程：制造对AM和PM制造材料、颗粒和纤维增强金属和塑料基复合材料以及热喷涂涂层的微观结构和机械行为的影响- 生产工程：金属工程和材料加工对微观结构的影响;过滤系统中局部特性对颗粒沉积的影响- 生物医学工程：表面结构、化学改性和曲率对生物膜生长的影响以及血管系统中血流的FE模拟，以预测动脉瘤的破裂并优化支架和弹簧圈几何形状在上述研究领域中，XTM将用于获取具有最高空间和对比度分辨率的材料系统的3D图像。计划进行各种现场试验，并将为此设计和建造试验台。因此，申请人将在（亚）微米水平上记录和分析由加工或由机械、腐蚀、侵蚀或热负荷引起的微观结构变化。使用建议之间的连接实验和多尺度模拟的基础上，断层图像的知识将实现一个重要的收获逐项研究领域。此外，将断层扫描收集的高分辨率3D数据与互补成像技术（例如SEM与EDX，EBSD）的结果相结合，将是推断对观察到的现象和影响的理解的关键因素。