Novel k-space microscope for soft x-ray photoelectron spectroscopy of bulk materials and buried interfaces

用于散装材料和掩埋界面软 X 射线光电子能谱的新型 k 空间显微镜

• 批准号: 326948345
• 负责人: Professor Dr. Ralph Claessen
• 金额: --
• 依托单位: Institut für Physik
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2017
• 资助国家: 德国
• 起止时间: 2016-12-31 至 2023-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/326948345?language=en
• 关键词: Novel; space; microscope; soft; ray

This project aims at the development of instrumentation for soft x-ray angle-resolved photoelectron spectroscopy (SX-ARPES) based on the novel concept of momentum- or k-space microscopy. For this purpose we will construct such an instrument for operation at high photon energies, and test and use it at the I09 soft x-ray beamline of the Diamond Light Source. Based on a special objective lens, optimized for momentum-space imaging, the instrument facilitates true two-dimensional electronic bandstructure mapping of solids with dramatically enhanced detection efficiency. Thereby overcoming the notoriously low count-rates of conventional SX-ARPES, this novel approach will allow to make full use of the central advantage of high-energy photoemission, namely its much larger probing depth, providing access to the bulk electronic structure and to buried interfaces. As case in point we want to use selected oxide heterostructures as testbed and study their fascinating electronic interface properties. The k-space microscope proposed here has the potential to revolutionize the field of photoelectron spectroscopy and open its application to new areas previously not thought to be accessible by this technique.

该项目旨在基于动量或 k 空间显微镜的新概念开发软 X 射线角分辨光电子能谱 (SX-ARPES) 仪器。为此，我们将构建这样一个在高光子能量下运行的仪器，并在钻石光源的 I09 软 X 射线光束线上测试和使用它。该仪器基于针对动量空间成像进行优化的特殊物镜，可实现固体的真正二维电子能带结构映射，并显着提高检测效率。这种新颖的方法克服了传统 SX-ARPES 众所周知的低计数率，将能够充分利用高能光电发射的核心优势，即其更大的探测深度，提供对体电子结构和埋入界面的访问。作为一个恰当的例子，我们希望使用选定的氧化物异质结构作为测试平台，并研究它们令人着迷的电子界面特性。这里提出的 k 空间显微镜有可能彻底改变光电子能谱领域，并将其应用扩展到以前认为该技术无法触及的新领域。