Tuning vanadium dioxide films by extreme straining - local investigations on transition phenomena and exotic phases
Tuning vanadium dioxide films by extreme straining - local investigations on transition phenomena and exotic phases
批准号:
362536548
负责人:
Professor Dr. Jan Ingo Flege
金额:
$0.0万
依托单位:
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2017
资助国家:
德国
项目状态:
已结题
起止时间:
2016-12-31 至 2020-12-31
中文摘要
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英文摘要
Vanadium dioxide is a correlated oxide with a metal-insulator transition at approximately 340 K. This transition is accompanied by a structural phase transition from the rutile metallic high-temperature structure to the monoclinic insulating low-temperature structure. The transition temperature can be tuned over a broad range by applying mechanical strain; also external electrical fields may drive the transition. Moreover, it is known that under mechanical straining further, exotic phases may occur. Consequently, vanadium dioxide exhibits a large potential for applications, e.g., in oxide electronics provided that these materials properties may be controlled and manipulated as thin films.In this project we investigate simultaneously and in situ the growth and the structural and electronic properties of vanadium dioxide films on ruthenium dioxide surfaces of different orientations by low-energy electron microscopy (LEEM). We exploit the fact that oxidizing the ruthenium surfaces leads to the coexistence of different crystallographically oriented ruthenium dioxide islands that will act as templates in subsequent vanadia growth. The lattice mismatch between vanadia and ruthenia suggests the occurrence of differently and, in some cases, extremely strained vanadia depending on its orientation. Due to this extreme straining, we expect the occurrence of novel, exotic phases and, more generally, a considerably broadened tuning range for the transition temperature of vanadia. These phases will be thoroughly characterized by LEEM and related local diffraction and spectroscopy techniques, including synchrotron-assisted methods. In a parallel effort, we aim to employ scanning probe microscopy to obtain unique insights into small-scale phase separation phenomena and also address, mindful of potential applications, the influence of applied electrical fields. Furthermore, we will extend our studies to ruthenium thin films deposited on sapphire substrates by magnetron sputtering, thereby pushing for higher technological relevance.
期刊论文(2)
专著(0)
科研奖励(0)
会议论文
DOI:
10.1021/acs.cgd.0c00120
发表时间:
2020-04-01
期刊:
CRYSTAL GROWTH & DESIGN
影响因子:
3.8
作者:
[Fischer, Simon, Krisponeit, Jon-Olaf, Flege, Jan Ingo]
通讯作者:
Flege, Jan Ingo
MOVPE growth and characterization of (AlxGa1-x)2O3 thin films for high power devices
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批准号:491040331
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项目类别:Research Grants
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资助金额:$0.0万
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财政年份:--
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负责人:Professor Dr. Jan Ingo Flege
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依托单位:
海外基金