Development of electron beam profile monitors using parametric X-ray radiation

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A beam profile is extremely useful for the examination of the beam emittance and optical parameters associated with accelerators. Optical transition radiation (OTR) is commonly used as a high precision profile monitor for electron beams in linacs. However, it was found that for short beam bunches in linacs dedicated to X-ray free electron lasers, the OTR becomes coherent, making it unsuitable for use as a beam profile monitor.In order to avoid this coherence, photons with shorter wavelengths are required. In this study, we propose to exploit parametric X-ray radiation through three new approaches: (i) a local method, (ii) a pinhole method, and (iii) a Fresnel-zone-plate (FZP) method. We have succeeded in performing proof-of-principle experiments on the local method and the pinhole method. In addition, we designed an experimental setup for the FZP method; its proof-of-principle experiment is in progress.