Fabrication of Conductive Quantum Wires based on Dislocation Technology

基于位错技术的导电量子线的制造

• 批准号: 24656376
• 负责人: WANG Zhongchang
• 金额: $ 2.58万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Challenging Exploratory Research
• 财政年份: 2012
• 资助国家: 日本
• 起止时间: 2012-04-01 至 2014-03-31
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-24656376/
• 关键词: 量子細線; 電子顕微鏡; 転位; 結晶界面

The sigma 5 (310)[001] MgO bicrystal was used as model system. Analyses of microstructure and electronic state near the boundary were performed based on an aberration corrected scanning transmission electron microscopy (STEM).The high angular annular dark field image in STEM showed formation of well-contacted atomically flat interface and also impurities segregation at or near the boundary. Ca and Ti impurities were detected at or near the boundary. The location of Ca and Ti atoms were examined by using atomic resolution elemental mapping. The elemental mapping revealed that the Ca atoms are localized only at the boundary, but Ti atoms form atomic wires along the neighboring sites of Ca. The theoretical calculation showed that Ti atomic wire induces semi conducing behavior in MgO insulator.

以σ 5（310）[001] MgO双晶为模型体系。利用像差校正扫描透射电子显微镜（STEM）对界面附近的微观结构和电子态进行了分析，大角度环形暗场像显示界面处形成了良好接触的原子级平坦界面，同时也显示了杂质在界面处或附近的偏聚。在边界处或附近检测到Ca和Ti杂质。Ca和Ti原子的位置进行了检查，通过使用原子分辨率元素映射。元素分布表明，Ca原子只分布在晶界上，而Ti原子沿着Ca的相邻位置形成原子线。理论计算表明，Ti原子线在MgO绝缘体中诱导了半导化行为。

项目成果

Physics behind the Ohmic Nature in Silicon Carbide Contacts

碳化硅触点中欧姆性质背后的物理原理

• 发表时间: 2013
• 作者: N. Makino;W. Sakamoto;K. Yoshida;M. Moriya;T. Yogo;Z. C. Wang
• 通讯作者: Z. C. Wang

Terraces at ohmic contact in SiC electronics: Structure and electronic states

• DOI: 10.1063/1.4729074
• 发表时间: 2012-06
• 期刊: Journal of Applied Physics
• 影响因子: 3.2
• 作者: Zhongchang Wang;M. Saito;S. Tsukimoto;Y. Ikuhara

Defective Boundaries in and between Functional Ceramics

功能陶瓷内部和之间的缺陷边界

• 发表时间: 2013
• 作者: 範滄宇;木口賢紀;今野豊彦;山田智明;雨澤浩史;Z. C. Wang
• 通讯作者: Z. C. Wang

Fluorine in Shark Teeth: Its Direct Atomic-Resolution Imaging and Strengthening Function

• DOI: 10.1002/anie.201307689
• 发表时间: 2014-02-03
• 期刊: ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
• 影响因子: 16.6
• 作者: Chen, Chunlin;Wang, Zhongchang;Ikuhara, Yuichi
• 通讯作者: Ikuhara, Yuichi

Ferromagnetic dislocations in antiferromagnetic NiO

• DOI: 10.1038/nnano.2013.45
• 发表时间: 2013-04-01
• 期刊: NATURE NANOTECHNOLOGY
• 影响因子: 38.3
• 作者: Sugiyama, Issei;Shibata, Naoya;Ikuhara, Yuichi
• 通讯作者: Ikuhara, Yuichi