Electron microscopy and electron diffraction of molecular compounds

分子化合物的电子显微镜和电子衍射

• 批准号: 418891022
• 负责人: Professorin Dr. Kerstin Volz
• 金额: --
• 依托单位: Wissenschaftliches Zentrum für Materialwissenschaften
• 依托单位国家: 德国
• 项目类别: Research Units
• 资助国家: 德国
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/418891022?language=en
• 关键词: Electron; microscopy; electron; diffraction; molecular

This project addresses the structure of various molecular assemblies investigated in the FOR 2824 by different electron microscopic techniques. The questions, which will be answered, are the exact arrangement of the molecular materials in crystalline solids as well as the degree of long-range order or the absence thereof. It is especially important to quantify the mesoscopic disorder in amorphous / crystalline mixtures as well as the nearest neighbor arrangement in amorphous solids and glasses. Only if the structure is clarified, we will be able to develop an understanding of the extremely nonlinear optical properties in experiment and in theory together with the partner projects. To answer these questions, the imaging conditions will be further adopted to the highly radiation sensitive specimen. Scanning transmission electron microscopy (STEM) with a precessing beam will be used to tackle the exact Radial Distribution Function, also for differently synthesized samples. Scanning precession electron diffraction will also yield the urgently needed information on the lateral distribution of amorphous and crystalline regions. Electron energy loss spectroscopy (EELS) will be applied to quantify chemical bonding and especially the change of bonding during irradiation, an important topic for later device applications. 4-dimensional STEM will be developed further to also be able to quantify electric fields in samples consisting of molecular materials and the results thereof will be correlated with the findings in the partner projects.

本项目通过不同的电子显微镜技术研究了for2824中各种分子组装的结构。这些问题，将被回答，是分子材料在结晶固体中的确切排列，以及程度的远程秩序或缺乏。量化非晶/晶体混合物中的介观无序以及非晶固体和玻璃中的最近邻排列尤为重要。只有澄清了结构，我们才能在实验和理论上与合作伙伴项目一起发展对极端非线性光学特性的理解。为了回答这些问题，我们将对高辐射敏感性标本进一步采用成像条件。带有处理光束的扫描透射电子显微镜（STEM）将用于处理精确的径向分布函数，也用于不同合成的样品。扫描进动电子衍射也将产生迫切需要的非晶态和晶态区域横向分布的信息。电子能量损失谱（EELS）将用于量化化学键，特别是辐照过程中化学键的变化，这是以后器件应用的一个重要课题。四维STEM将进一步发展，也能够量化由分子材料组成的样品中的电场，其结果将与合作伙伴项目的发现相关联。