Transmission Electron Microscope (TEM)

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The proposed transmission electron microscope (TEM) will be a replacement instrument for our old 120 kV LaB6 JEOL JEM 1210 STEM that was financed by the DFG in 1994. The new instrument will combine improved techniques of imaging, selective area electron diffraction and energy dispersive X-ray analysis for working with beam sensitive materials, namely clay minerals, nanoparticles, thin films (e.g. plasma coated, biochemical or metallic treated specimens). The successful combination of high-resolution imaging, election diffraction and compositional analyses (using energy dispersive X-rays) at the submicron- to nanometer-scale of observation is a key requirement for our current research activities on fine particulate materials (clay minerals and nanoparticles) and thin filmed/interface materials. The TEM will be housed in the geosciences Electron Microbeam Unit adjacent to the FIB-SEM room to minimize the transport distance of the delicate TEM lamellae. The equipment will be managed as part of the Electron Microbeam Unit, which is run by the Economic geology, mineralogy and geochemistry working group will provide the technical support staff, space and sample preparation tools needed for the new instrument. The microscope will support current and ongoing activities of research groups from the geosciences, physics and biochemistry.