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Study of X-ray waveguide and functional device

X射线波导及功能器件研究

基本信息

批准号：
03452180
负责人：
MIYAZAKI Yasumitsu
金额：
$ 4.29万
依托单位：
Toyohashi University of Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (B)
财政年份：
1991
资助国家：
日本
起止时间：
1991 至 1993
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-03452180/
关键词：
X-ray beam X-ray functional device X-ray waveguide Soft X-ray Scattering analysis Multilayr Reflection analysis Cylindrical lattice X線ビ-ム波

项目摘要

1. Characteristics of X-ray beam using cylindrical modelScattering and reflection characteristics of X-ray beams at pararell muti atom interface was analyzed by using boundary element method for X-ray waveguides and functional devices. Atomic boundary surface was considered as multilayr array of perfectly conducting cylinders. The dependence of the scattering fields on incident angle and wavelength of X-ray beam is estimated. It was found that the diffraction direction is the wavelength dependence.2. Scattering by atomsIn order to consider the electron cloud in an atom, the heterogeneous refractive index distribution of the atomic structure at X-ray wavelength region was theoretically investigated. The characteristics of X-ray scattering based on dielectric cylindrical model which has heterogeneous index is analyzed. This analysis used finite element method in atomic regions and boundary element method in other regions. The distribution of electric field in a carbon atom was estimated.3. Analysis of X-ray reflection on multilayrThe reflection and transmission characteristics of soft X-rays of multilayr mirrors was examined for low-loss X-ray waveguide. The dependence of reflectiveity on incident angle, wavelength and number of layrs for Rh/Si multilayr mirror was evaluated. It was found that 60% reflectivity can be realized at the wavelength of 200A for an incedent angle of 80.4. X-ray deviceAn X-ray focusing device using a graded index medium was studied. The focusing characteristcs were analyzed by ray tracing method. It was shown that X-ray can be converged by this device. The electric fields of the device were also investigated by beam propagation method.

1.用边界元法分析了X射线在平行多原子界面上的散射和反射特性。将原子边界面视为多层理想导电圆柱阵列。计算了散射场随入射角和X射线波长的变化关系。发现衍射方向与波长有关.为了考虑原子中的电子云，从理论上研究了原子结构在X射线波段的非均匀折射率分布。分析了具有非均匀折射率的介质柱模型的X射线散射特性。分析中原子区域采用有限元法，其它区域采用边界元法。计算了碳原子内部的电场分布. X射线在多层膜上的反射分析研究了低损耗X射线波导多层膜反射镜对软X射线的反射和透射特性。研究了Rh/Si多层膜反射镜的反射率与入射角、波长和膜层数的关系。实验结果表明，当入射角为80.4 °时，在200埃波长处可实现60%的反射率。X射线聚焦装置研究了一种采用梯度折射率介质的X射线聚焦装置。用光线追迹法分析了其聚焦特性。结果表明，该装置可以会聚X射线。用光束传输法研究了器件的电场分布。