Study of electronic structure and chemical analysis of solids by means of soft-xray emission

最近，几位研究人员利用同步辐射进行了软X射线发射光谱(SXES)研究。SXES为材料科学带来了新的信息。软X射线辐射是一种偶极跃迁，对角动量有明确的选择规律。它主要是在相同的原子物种内造成的，因为核心是强烈局域化的。因此，依赖于原子的态密度的部分分量可以用SXES来研究，特别是对于轻元素，如B，C，N和O元素，这是显而易见的。此外，还发现了几种材料在软X射线区的非弹性光散射过程和荧光过程。激发光源来自安装在PF环的波荡器光束线BL2B、BL16U和BL19B以及弯曲光束线BL3B。在这些光束线中，样品处的光子通量为每秒10^lt；11；-10^lt；12；

Very recently, soft x-ray emission spectroscopy (SXES) using synchrotron radiation has been performed by several researchers. The SXES brings new information to the material sciences. Soft x-ray emission is has a clear selection rule about the angular momentum, because it is a dipole transition. It is caused mainly within the same atomic species, because the core is strongly localized. Thus, the partial components of the density of states depend on the atom can be studied by SXES.Especially, it is evident for the light element, such as B,C,N,and O elements. Furthermore, inelastic-light-scattering process has been found in the soft x-ray region for the several materials as well as the fluorescence process. The excitation-light source is used from the undulator beam lines BL2B,BL16u and BL19B as well as the bending beam line BL3B which are installed at PF ring. In these beam lines, photon flux at the sample is 10^<11>-10^<12> photons per second.