Streak camera with laser system

我们申请的条纹相机/激光系统应该是用于在皮秒范围内的系统的时间动态的空间分辨测量。这样一个系统与快速检测器是需要的激子极化激元在半导体微腔中的性质的研究，因为重要的过程演变的时间尺度小于100 ps。此外，该系统需要用于测量微激光器和量子发射器的光子统计，以克服当前使用的探测器所给出的限制。

The Streak camera/laser system we apply for is supposed to be utilized for spatially resolved measurements of the temporal dynamics of systems in the picosecond range. Such a system with a fast detector is needed for the study of the properties of exciton-polaritons in semiconductor microcavities, because the important processes evolve over time scales less than 100 ps. Furthermore, the system is needed for the measurement of photon statistics of microlasers and quantum emitters , to overcome the limitations given by the currently used detectors.