Study of structural fluctuation of nanomaterials by Cs-corrected electron lenses

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During the research period of three years (2005-07), the present group has published 19 original papers, 24 proceedings of international meetings, 4 reviews and 5 books including chapter-writing on the development of new measurement methods of structural fluctuation of nano-materials by using spherical aberration correction in transmission electron microscopy (TEM) as follows :(1) Observation of 0.2nm resolution in lanthanide oxides high-k materials/silicon interfaces by Cs-corrected TEM.(2) Observation of elemental fluctuation of the lanthanide oxide/silicon interfaces by using Cs-corrected TEM.(3) Observation of six-member rings in single wall carbon nanotubes by Cs-corrected TEM. The result was reported on commercial news papers such as Asahi News Paper.(4) Observation of oxygen-defect structures in photocatalytic titanium oxides caused by irradiation of light with shortage of oxygen.(5) Visualization of aluminum atoms in AJNiCo quaicrystals by using Cs-corrected TEM and discussion of their stability with the structural fluctuation.(6) Observation of a new interface structure between germanium quantum dos and slightly oxidized silicon.