Development of bio-microwave atomic force microscopy and noninvasive measurement of cell activity

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A novel microscopy which is capable of investigating surface topography and electrical property of cells simultaneously on a sub-nanometer scale was developed. The microwave atomic force microscopy(M-AFM) is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. The waveguide structure of the M-AFM probe allows microwave signals to propagate through the probe and emit from the tip of it. Based on the theoretical analysis and the measured amplitude and phase information of microwave signals, M-AFM can implement the quantitative characterization of the local conductivity and permittivity of cells on the sub-nanometer scale.