权益分类	功能权益	普通用户	{{item.name}}会员
{{category.name}}	{{benefitItem.name}}

NUMERICAL EVALUATION FOR EROSION OF ELECTRICAL CONTACTS MOUNTED ON CONTROL RELAYS.

安装在控制继电器上的电触点腐蚀的数值评估。

基本信息

批准号：
09450111
负责人：
KUBONO Takayoshi
金额：
$ 6.21万
依托单位：
SHIZUOKA UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B).
财政年份：
1997
资助国家：
日本
起止时间：
1997 至 2000
项目状态：
已结题

项目摘要

The sample contact was made from silver oxidation cadmium (Ag/CdO), silver oxidation tin (Ag/SnO2), which had been spotlighted as a material without cadmium, silver tin (Ag/Sn), silver (Ag), and palladium (Pd). These contacts were mounted on the test relays, which had the contact force 0.45N and opening force 0.15N.By repeating the make-only-operation and break-only-operation in the resistance circuit of direct current 30v-10A, the shape change of pip on the contact surfaces and sticking occurrence condition were examined.On the Ag/CdO12wt% contacts, the break-only-contacts had no large pip ; the make-only contacts had a large pip on the negative electrode. Between the height H and the root diameter Dr of a pip, and the initial contact gap G, it was discovered that the contact sticking rose, when it reaches the relationship between "H/G>0.5 and H/Dr>0.5". These numerical values are useful for the judgment for the replacement of the relay, when the electric system equipment is checked.Though the Ag/SnO_212wt% contacts had a comparatively large pip on the negative electrode, the contact sticking did not arise because a large pip suddenly collapsed. The Ag/Sn9.5% contacts had the welding in the contact period carrying current. The Ag contacts showed that the root diameter of pip was thick, and the height was low. The Pd contacts showed that the large pip appeared on the anode, and suddenly collapsed.By measuring the intensity of spectral components from switching arc, which induced the transferred pip, temperature and atomic density in the arc column were measured, and the contact erosion was examined.

样品接触件由银氧化镉（Ag/CdO）、银氧化锡（Ag/SnO 2）（其作为不含镉的材料而受到关注）、银锡（Ag/Sn）、银（Ag）和钯（Pd）制成。将这些触头安装在接触力为0.45N、分断力为0.15N的测试继电器上。通过在直流30 v-10A的电阻电路中重复只通操作和只断操作，检查了接触表面点状物的形状变化和粘附发生情况。在Ag/CdO12wt%触头上，只断触头没有大的点状物;仅接通触点在负电极上具有大的点。在高度H和齿根直径Dr与初始接触间隙G之间，发现当达到“H/G>0.5和H/Dr>0.5”的关系时，接触粘附增加。Ag/SnO_212wt%触头在负极上虽然有较大的突起，但由于突起突然塌陷，没有发生触头粘连。Ag/Sn9.5%触头在通电接触过程中发生焊接。银触点显示，种子根直径粗，高度低。通过测量引起转移点的开关电弧光谱分量的强度，测量了弧柱中的温度和原子密度，并对触头烧蚀进行了分析。