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The numerical evaluation study for the relationship between contact-sticking and transferred pip on electrical contacts mounted on relays in DC 42V automobile circuit

The numerical evaluation study for the relationship between contact-sticking and transferred pip on electrical contacts mounted on relays in DC 42V automobile circuit
直流42V汽车电路继电器电接点粘连与移管关系数值评价研究
批准号:
15360148
负责人:
KUBONO Takayoshi
金额:
$8.58万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2006

项目摘要

项目成果

KUBONO Takayoshi的其他基金

相关文献

中文摘要
翻译
在两个继电器上分别安装的只合触点和只断触点上,每隔100次从两个方向的开关操作,用两台数码显微镜拍摄了传输点的生长过程。在平行布置的两悬臂支撑臂顶端接触面堆积的转移点形状不是圆锥形的,并且随着转移点高度的放大而成为狮身人面像型。这种类似于狮身人面像的pip的形成过程被认为是电弧柱中蒸发的原子和分散的粒子堆积在平行支撑臂的顶部,因为每次电弧放电的电弧柱都受到通过这些臂的电弧电流的安培力的挤压。此外,我们认为,当pip大大增加时,仅制造操作的接触面部分熔化,这些接触面在静态接触期间焊接,因为在接触前和反弹期间出现了更多的电弧放电和熔融桥。对于转移点和侵蚀坑形状的测量,采用扫描激光显微镜对电极上形成的转移点和侵蚀坑进行三维图像观察和数值评价(深度、高度、直径测量和体积计算)。特别是在体积测量方面,分别提出了“梯形近似算法”和“分梯形近似算法”。此外,为了比较不同接触材料和/或在不同载荷条件下形成的点和侵蚀坑的形状,以点高度或坑深值为纵轴,以其直径为横轴绘制图形已被证实是有用的。采用低速和恒速分离装置,在lms间隔内拍摄断弧图。研究发现,在断弧放电初期和电弧电压波形波动较大的部分,电弧亮点位置的波动范围较大,而在断弧放电后期,电弧亮点位置的波动范围较小。在主页http://www.ipc.shizuoka.ac.jp/~tjsekik/中报道了“转点生长过程的动态图片以及断弧放电阴极点和阳极点的运动情况”。少
英文摘要
The growing process of the transferred pips at the make-only contacts or the break-only contacts mounted individually on two relays has been photographed every 100 switching operations from two directions by two digital microscopes. The shape of transferred pips piled up at the surfaces of contacts on the tips of two cantilever supporting arms arranged parallel is not conical, and becomes the sphinx image type with the magnification of the height of transferred pip. This formation process of pip which resembles the sphinx image is considered that the evaporated atoms and scattered particles in the arc column are piled up at the top side of the parallel supporting arms, because the arc column of each arc discharge is extruded by the Ampere force for the arc current carried through these arms. Moreover, we think that when the pip greatly grew, the contact surfaces at make-only operation are melted partially and these surfaces were welded at the static contact period, because the appearan … More ce of the arc discharge and the molten bridge just before making contacts and in the rebound period are confirmed from the voltage waveform.With respect to measurement of shapes of transferred pips and eroded craters, a scanning laser microscope was used to per-form 3-D image observation as well as numerical evaluation (measurements of depth, height, diameter, and volume calculation) of the transferred pips and eroded craters formed on the electrodes. Especially, for the volume measurement, new algorithms called "Trapezoidal Approximation Algorithm" and "Divided Trapezoidal Approximation Algorithm", respectively, were developed. Moreover, in order to make comparisons of shapes of pips and eroded craters formed for different contact materials and/or under different load conditions, drawing a graph by employing the pip height or crater depth values as the vertical axis and their diameters as the horizontal axis has been confirmed to be useful.Using the low-speed and constant-speed separating equipment, the figures of breaking arc were photographed in the lms interval. it is found that the fluctuating range of the location in arc bright spots was big in the initial stage of breaking arc discharge and in the big fluctuating part of arc voltage waveform, and on the other hand that the fluctuating range of the location of arc bright spots was narrow in the later stage of breaking arc discharge.In Home page http://www.ipc.shizuoka.ac.jp/~tjsekik/, the following were reported "Moving pictures of growing process of the transferred pips and the motion situation of cathode spot and anode spot of breaking arc discharge". Less
期刊论文(113)
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会议论文
New Algorithm for Volumetric Analysis of Contact Damages with Laser Microscope Data
利用激光显微镜数据对接触损伤进行体积分析的新算法
DOI: --
发表时间: 2006
期刊: Proceedings of the 23rd International Conference on Electrical Contacts together with IS-EMD2006 of IEICE, 6-9 June 2006, Sendai, JAPAN
影响因子: --
作者: [Makoto HASEGAWA, Kazutaka IZUMI, Yusuke KAMADA]
通讯作者: Yusuke KAMADA
DOI: --
发表时间: 2005
期刊: Proceedings of 51st IEEE Holm Conference on Electrical Contacts, September 26-28, 2005, at Holiday Inn Chicago City Center Chicago, IL USA
影响因子: --
作者: [Junya SEKIKAWA, Takayoshi KUBONO]
通讯作者: Takayoshi KUBONO
Three-dimensional evaluation of contact surface damages with a scanning laser microscope
使用扫描激光显微镜三维评估接触表面损伤
DOI: --
发表时间: 2005
期刊: Proceedings of 53rd Relay and Switch Technology Conference, April 18-20,2005, Costa Mesa, California, USA
影响因子: --
作者: [Makoto Hasegawa, Kazutaka Izumi, Masato Akita]
通讯作者: Masato Akita
最小アーク電流値の再解釈に関する実験的考察
重新解释最小电弧电流值的实验考虑
DOI: --
发表时间: 2005
期刊: 2005年電子情報通信学会総合大会論文集 CS-5-4(CD-ROM)
影响因子: --
作者: [長谷川 誠, 鎌田裕介]
通讯作者: 鎌田裕介
68
    NUMERICAL EVALUATION FOR EROSION OF ELECTRICAL CONTACTS MOUNTED ON CONTROL RELAYS.
    • 批准号:
      09450111
    • 项目类别:
      Grant-in-Aid for Scientific Research (B).
    • 资助金额:
      $6.21万
    • 财政年份:
      1997
    • 负责人:
      KUBONO Takayoshi
    • 依托单位: