Development of measurement system for opt-electronic properties of nano-material using nanotube nanotweezers

利用纳米管纳米镊子开发纳米材料光电特性测量系统

• 批准号: 14350023
• 负责人: AKITA Seiji
• 金额: $ 9.09万
• 依托单位: Osaka prefecture University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350023/
• 关键词: Carbon nanotubes; nano-tool; nanomanipulation; nanotweezes; Joule heating; Contact resistance; atomic force microscope; ナノファクトリー; 近接場光顕微鏡; ナノ可変抵抗器; ナノメカニクス; 電気的光学的特性; 輻射発光; 電子線誘起薄膜体積

In that research, we have proposed a multifunctional nano-processing tool using carbon annotates, which consists of nanotweezers with an optical fiber tip. The nano-tool enables us to investigate the optical and the electrical properties of the nanoscale materials1.We have developed nano-processing technique for individual nanotubes to fabricate the nanotools using a "nanofactory" which incorporated manipulators in a scanning electron microscope (SEM). Processing by Joule heating of individual multiwall nanotubes (MWNTs) was very useful for sharpening of a nanotube tip, length adjustment, exfoliation of outer shell and extraction of inner-layers. These were also clarified about the fundamental properties of MWNTs, such as nano-tribology for interlayer of the MWNTs, the electrical conduction characteristics between layers, etc. We have also found that the electron beam irradiation at the contact between the nanotube and the electrode under current flow induced the improvement of the contact resistance.2. In order to investigate the light emission properties of the nanomaterials, an optical measurement system, which consisted of a cooled CCD and a monochromator, was installed in the nanofactory. This enabled us to measure a sublimation temperature of the MWNTs were estimated to be in the range around 2500K. Furthermore, the thermoionic emissions from the heated MWNT was also observed under external electric field simultaneously. Thus, the nanotube should be used as the minute white light source, heat source, and electron emitter.3.An atomic force microscopy using the fabricated nanotools attached on the optical filber tip was demonstrated. We have also succeeded in nanotube attachment of the loop shape to the optical fiber tip. This device can be used as a nano light source in the AFM operation

在这项研究中，我们提出了一种多功能的纳米加工工具，使用碳注释，其中包括纳米镊子与光纤尖端。纳米工具使我们能够研究纳米材料的光学和电学性质1.我们已经开发了单个纳米管的纳米加工技术，使用“纳米工厂”制造纳米工具，该纳米工厂将操作器结合在扫描电子显微镜（SEM）中。通过焦耳加热处理单个多壁纳米管（MWNTs）对于纳米管尖端的锐化、长度调整、外壳的剥离和内层的提取是非常有用的。这些也阐明了MWNTs的基本性质，如MWNTs的层间纳米摩擦学，层间导电特性等，我们还发现，在电流下的纳米管和电极之间的接触处的电子束照射引起的接触电阻的改善.为了研究纳米材料的发光特性，在纳米工厂中安装了由冷却CCD和单色器组成的光学测量系统。这使得我们能够测量MWNT的升华温度，估计在2500K左右的范围内。此外，在外加电场的作用下，还观察到了热离子发射。因此，该纳米管可作为微小的白色光源、热源和电子发射器。3.将所制备的纳米工具附着在光学纤维尖端上，实现原子力显微镜观察。我们还成功地将环形状的纳米管附着到光纤尖端。该器件可作为原子力显微镜的纳米光源

项目成果

S.Akita, Y.Nakayama: "Scanning Probe Microscope Tip with Carbon Nanotube Truss"Jpn.J.Appl.Phys.. 43. 4499-4501 (2004)

S.Akita，Y.Nakayama：“带有碳纳米管桁架的扫描探针显微镜尖端”Jpn.J.Appl.Phys.. 43. 4499-4501 (2004)

S.Akita, Y.Nakayama: "Scanning Probe Microscope Tip with Carbon Nanotube Truss"Jpn.J.Appl.Phys.. 43[7B]. 4499-4501 (2004)

S.Akita，Y.Nakayama：“带有碳纳米管桁架的扫描探针显微镜尖端”Jpn.J.Appl.Phys.. 43[7B]。

Y.Nakayama, S.Akita: "Nanoengineering of Carbon Nanotubes for Nanotools"new journals of Physics. 5. 128.1-128.23 (2003)

Y.Nakayama，S.Akita：“纳米工具用碳纳米管的纳米工程”新物理学期刊。

S.Akita, Y.Nakayama: "Extraction of Inner Shell from Multiwall carbon Nanotubes for Scanning Probe Microscope Tip"Jpn.J.Appl.Phys.. 42[6B]. 3933-3936 (2003)

S.Akita，Y.Nakayama：“从用于扫描探针显微镜尖端的多壁碳纳米管中提取内壳”Jpn.J.Appl.Phys.. 42[6B]。

S.Akita, Y.Nakayama: "Scanning probe microscope tip with carbon nanotube truss"Japanese Journal of Applied Physics. Vol.43,No.7B(印刷中). (2004)

S.Akita，Y.Nakayama：“带有碳纳米管桁架的扫描探针显微镜尖端”，日本应用物理学杂志，第 43 卷，第 7B 期（出版中）。