权益分类	功能权益	普通用户	{{item.name}}会员
{{category.name}}	{{benefitItem.name}}

Development of the in-situ measurement compound equipment of the power between the surfaces, and surface detailed structure

面间功率及面详细结构原位测量复合装置的研制

基本信息

批准号：
11555200
负责人：
HIGASHTIANI Ko
金额：
$ 8.83万
依托单位：
KYOTO UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B).
财政年份：
1999
资助国家：
日本
起止时间：
1999 至 2000
项目状态：
已结题

项目摘要

An atomic force microscope (AFM) is the apparatus that can measure in-situ both surface structure and interaction forces, and is imrortant as a prototype for new compounded equipment development used for interface research in the future. As the first step, using AFM used from the former, AFM images and surface force profiles of mica surfaces on which surfactants and polymers adsorb in their aqueous solutions are measured and their adsorption mechanisms are investigated. A new apparatus, which is combined optical microscope and AFM and can measure surface force and optical image at the interface simultaneously, is developed. By using this apparatus, the existence of air bubbles of nano size is checked on the hydrophobic surface in aqueous solution, and presumption of the origin of the long-range attractive force between hydrophobic surfaces is investigated. Next, using the scanning near field optical microscope (SNOM) that has a similar scanning mechanism to AFM, in-situ surface observa … More tion in liquid is tried. For this trial, using argon laser for the source of luminescence from the probe, in-situ observation of the glass surface in solution is successfully carried out and a surface image and a surface optical image are obtained. For about other systems, it is found out that aqueous solutions of electrolyte, surfactant, polymer, etc., and transparent samples such as quarts and glass are applicable. And it is found out that a surface fluorescence image may be obtained if the fluorescence probe is introduced onto the surface and an excitation light is employed for a light source. As these applications, a fine spectroscopic analysis can be developed. However, since the weak point where S/N ratio is bad because of weak light source is expected, the sensitivity of usual FTIR is examined first. Consequently, it is found out that influence of trace contamination cannot be disregarded and devices, such as employing vacuumed sample room and pure optical fiber, are required. Therefore, the application to a fine spectroscopic analysis needs to wait for improvement of future equipment. Less

原子力显微镜（AFM）是一种既能测量表面结构又能测量相互作用力的仪器，是未来开发用于界面研究的新型复合设备的重要原型。作为第一步，利用前者的AFM，测量了表面活性剂和聚合物在其水溶液中吸附的云母表面的AFM图像和表面力分布，并研究了其吸附机理。研制了一种将光学显微镜和原子力显微镜相结合，同时测量界面表面力和光学图像的新型仪器。利用该装置，验证了水溶液中疏水表面是否存在纳米级气泡，并对疏水表面间远程引力的来源进行了推测。其次，利用扫描近场光学显微镜（SNOM），具有与原子力显微镜（AFM）相似的扫描机制，对液体表面进行了原位观测。在本次试验中，利用氩气激光器作为探针的发光源，成功地对溶液中的玻璃表面进行了原位观测，获得了表面图像和表面光学图像。对于其他体系，发现电解液、表面活性剂、聚合物等水溶液以及透明样品如石英、玻璃等均适用。在表面上引入荧光探针，以激发光作为光源，可以得到表面荧光图像。在这些应用中，可以发展精细的光谱分析。但是，由于预料到弱光源导致信噪比差的弱点，因此首先检查常规FTIR的灵敏度。因此，微量污染的影响是不可忽视的，需要采用真空取样室和纯光纤等设备。因此，将其应用于精细光谱分析还需要等待未来设备的改进。少