Development of the in-situ measurement compound equipment of the power between the surfaces, and surface detailed structure

原子力显微镜(AFM)是一种可以现场测量表面结构和相互作用力的仪器，是未来用于界面研究的新型复合设备开发的重要原型。第一步，利用原子力显微镜，测量了表面活性剂和聚合物在其水溶液中吸附的云母表面的AFM图像和表面力分布，并研究了它们的吸附机理。将光学显微镜和原子力显微镜相结合，研制了一种能同时测量界面处表面力和光学图像的新装置。利用该装置检测了水溶液中疏水表面上纳米气泡的存在，并对疏水表面之间的长程引力的来源进行了推测。其次，利用与原子力显微镜具有相似扫描机理的扫描近场光学显微镜，对…进行了原位表面观察人们尝试了更多的液体疗法。在本实验中，利用Ar激光作为探头的发光源，成功地对溶液中的玻璃表面进行了原位观测，并获得了表面图像和表面光学图像。对于其他体系，发现电解液、表面活性剂、聚合物等水溶液以及石英石和玻璃等透明样品都是适用的。发现如果将荧光探头引入表面，并采用激发光作为光源，就可以获得表面荧光图像。作为这些应用，可以开发出精细的光谱分析。然而，由于预计会出现弱光源导致S/氮比变差的弱点，所以首先考察了常用的傅立叶变换红外光谱的灵敏度。由此发现，微量污染的影响不容忽视，需要使用真空取样室和纯光纤等设备。因此，精细光谱分析的应用还需要等待未来设备的改进。较少

An atomic force microscope (AFM) is the apparatus that can measure in-situ both surface structure and interaction forces, and is imrortant as a prototype for new compounded equipment development used for interface research in the future. As the first step, using AFM used from the former, AFM images and surface force profiles of mica surfaces on which surfactants and polymers adsorb in their aqueous solutions are measured and their adsorption mechanisms are investigated. A new apparatus, which is combined optical microscope and AFM and can measure surface force and optical image at the interface simultaneously, is developed. By using this apparatus, the existence of air bubbles of nano size is checked on the hydrophobic surface in aqueous solution, and presumption of the origin of the long-range attractive force between hydrophobic surfaces is investigated. Next, using the scanning near field optical microscope (SNOM) that has a similar scanning mechanism to AFM, in-situ surface observa … More tion in liquid is tried. For this trial, using argon laser for the source of luminescence from the probe, in-situ observation of the glass surface in solution is successfully carried out and a surface image and a surface optical image are obtained. For about other systems, it is found out that aqueous solutions of electrolyte, surfactant, polymer, etc., and transparent samples such as quarts and glass are applicable. And it is found out that a surface fluorescence image may be obtained if the fluorescence probe is introduced onto the surface and an excitation light is employed for a light source. As these applications, a fine spectroscopic analysis can be developed. However, since the weak point where S/N ratio is bad because of weak light source is expected, the sensitivity of usual FTIR is examined first. Consequently, it is found out that influence of trace contamination cannot be disregarded and devices, such as employing vacuumed sample room and pure optical fiber, are required. Therefore, the application to a fine spectroscopic analysis needs to wait for improvement of future equipment. Less