Development of high-energy X-ray fluorescence analysis and application to the study of origin of earth and planetary materials

高能X射线荧光分析技术的发展及其在地球和行星物质起源研究中的应用

• 批准号: 12554020
• 负责人: NAKAI Izumi
• 金额: $ 8.64万
• 依托单位: Tokyo University of Science
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2000
• 资助国家: 日本
• 起止时间: 2000 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-12554020/
• 关键词: X-ray fluorescence analysis; synchrotron radiation; high-energy X-ray; heavy element analysis; trace element analysis; geological application; archaeological application; forensic application; ガーネット; 塗膜試料; SPring-8; 非破壊分析; 重元素分析; 法科学; 異同識別 /

Traditionally, the X-ray fluorescence (XRF) analysis of heavy elements is based on their L-series spectral lines. This is because the K-lines of these elements are difficult to excite by commercially available XRF spectrometers. A typical energy dispersive X-ray fluorescence spectrum of a multi-component material in energy regions of less than 20 keV is usually crowded with an overlap of the K, L, and M emission lines of the component elements. In contrast, the XRF spectrum above 20keV contains only K lines, and the spectrum becomes simple. Therefore, the use of the K-lines is ideal for the analysis of heavy elements of atomic number Z ≧45 (=Rh Kα_1=20.12 KeV). We have developed for the first time high energy XRF analysis utilizing 116keV X-rays from synchrotron radiation source of Spring-8 and found that this technique enables us to determine all heavy elements with sufficient sensitivity. The minimum detection limit was at a sub-ppm level. This technique has been successfully applied to two-dimensional analysis of zoning of heavy elements in garnet, forensic identification of automobile paints, provenance analysis of old-china wares from Kutani and Arita and the potential advantages of this technique have been elucidated. High-energy XRF analyses will become a powerful tool for analyzing environmental samples, archaeological samples, forensic samples, geochemical samples, and high-tech materials containing heavy elements such as rare earth elements. It is expected that the utilization of high-energy X-rays will open new application fields for X-ray fluorescence analyses

传统上，重元素的X射线荧光（XRF）分析是基于它们的L系列谱线。这是因为这些元素的K线很难被市售的XRF光谱仪激发。在小于20 keV的能量区域中的多组分材料的典型能量色散X射线荧光光谱通常挤满了组分元素的K、L和M发射线的重叠。相比之下，20 keV以上的XRF光谱只包含K线，光谱变得简单。因此，K线是分析原子序数Z = 45（=Rh Kα_1= 20.12KeV）重元素的理想方法。我们首次利用Spring-8同步辐射源的116 keV X射线进行了高能X射线荧光分析，发现该技术使我们能够以足够的灵敏度测定所有重元素。最低检测限为亚ppm水平。该技术已成功地应用于石榴石重元素分带的二维分析、汽车漆的法医鉴定、久谷和有田古瓷器的产地分析等，并阐明了该技术的潜在优势。高能XRF分析将成为分析环境样品、考古样品、法医样品、地球化学样品以及含有稀土元素等重元素的高科技材料的有力工具。高能X射线的应用将为X射线荧光分析开辟新的应用领域

项目成果

K.Fukuda, M.Matsunaga, Y.Kato, I.Nakai: "Chemical speciation of trace titanium in Hamersley banded iron formations by X-ray fluorescence imaging and XANES analysis"J. Trace and Microprobe Techniques. 19. 509-519 (2001)

K.Fukuda、M.Matsunaga、Y.Kato、I.Nakai：“通过 X 射线荧光成像和 XANES 分析对哈默斯利带状铁地层中痕量钛的化学形态进行分析”J。

I.Nakai, Y.Terada, T.Ninomiya: "Forensic application of Synchrotron Radiation X-ray Fluorescence Analysis"Proc. of 16th Meetings of the International Association of Forensic Sciences. 2002. 29-34 (2002)

I.Nakai、Y.Terada、T.Ninomiya：“同步辐射 X 射线荧光分析的法医应用”Proc。

Y. Terada, K. Yasaka, F. Nishikawa, T. Konishi, M. Yoshio, I. Nakai: "In situ XAFS analysis of Li(Mn,M)204(M=Cr,Co,Ni)5V cathode materials for Lithiumion secondary batteries"J, Solid State Chem.. 156. 286-291 (2001)

Y. Terada、K. Yasaka、F. Nishikawa、T. Konishi、M. Yoshio、I. Nakai：“Li(Mn,M)204(M=Cr,Co,Ni)5V 正极材料的原位 XAFS 分析

K. Fukuda, M. Matsunaga, Y. Kato, I. Nakai: "Chemical speciation of trace titanium in Hamersley banded iron formations by X-ray fluorescence imagine and XANES analysis"J. Trace and Microprobe Techniques. 19. 509-519 (2001)

K. Fukuda、M. Matsunaga、Y. Kato、I. Nakai：“通过 X 射线荧光成像和 XANES 分析对哈默斯利带状铁地层中痕量钛的化学形态进行分析”J。

寺田靖子, 中井 泉: "高エネルギー蛍光X線分析"岩石鉱物科学. 30. 88-89 (2001)

Yasuko Terada、Izumi Nakai：“高能 X 射线荧光分析”《岩石与矿物科学》30. 88-89 (2001)。