课题基金 / 基金详情

Study on suppression of fluctuation in semiconductor electrical characteristics by single ion inplantaticn

Study on suppression of fluctuation in semiconductor electrical characteristics by single ion inplantaticn
单离子植入抑制半导体电特性波动的研究
批准号:
12555092
负责人:
ODOMARI Iwao
金额:
$8.64万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2002

项目摘要

项目成果

ODOMARI Iwao的其他基金

相关文献

中文摘要
翻译
点击翻译按钮获取中文摘要
英文摘要
In order to develop potentialities of single ion implantation through die precise control of solid-state physical and chemical properties in nano-scale semiconductors by one-by-one implantation of dopant atoms, we demonstrated the control of the electrical characteristics in ultrafine semiconductor devices and the selective growth of carbon nanotubes/fibers at catalytic ion-implanted site as follows.Control of electrical properties in ultrafine semiconductor devicesThe influence of dopant atom position on V_<th> in silicon wire MOSFETs was experimentally investigated for the first time by means of SIX. P single-ions were implanted into n-type channel region at intervals of 100nm. V_<th> was evaluated and compared with that of conventional FETs in which the dopant atoms were randomly introduced. Our results indicate that V_<th> fluctuation of FETs with ordered dopant distribution was smaller than that of FETs with random channel doping. It was also found that the average value of V_<th> … More of FETs with the ordered dopants was much lower than that of FETs with the random distribution of dopants, even though the dopant number was exactly same for both FETs. This indicates that it is important to control the dopant position for the precise control of V_<th>.Position control of carbon nanotubes/fibersThe precise control of individual CNFs position on substrate is essential for opening up novel device applications. We attempted to control the growth position of CNFs by means of focused Ni ion implantation and the subsequent plasma chemical vapor deposition (CVD). Ni ions were implanted at 30kV into n-type Si(100) substrate through the thermally grown oxide film. After a removal of thermal oxide, an antenna edge 2450MHz microwave plasma assistant CVD was carried out at 600℃ for 10 min with pure hydrogen and methane over 99.9999% for the CNF growth. The selective growth of CNFs on Ni-implanted sites was observed. It was confirmed for the first time that the implanted Ni ions act as a catalyst for the synthesis of CNFs. Less
期刊论文(94)
专著(0)
科研奖励(0)
会议论文
Koh M, Goto T, Sugita A, Tanii T, Iida, T, Shinada T, Matsukawa T, Ohdomari I: "Novel process for high-density buried nanopyramid array fabrication by means of dopant ion implantation and wet etching"JJAP. 40巻4B号. 2837-2839 (2001)
Koh M、Goto T、Sugita A、Tanii T、Iida、T、Shinada T、Matsukawa T、Ohdomari I:“通过掺杂离子注入和湿法蚀刻制造高密度掩埋纳米金字塔阵列的新工艺”JJAP 40 卷。第 4B 号。2837-2839 (2001)
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Watanabe T, Tatsumura K, Kajimoto A, Inaba Y, Ogura K, Ohdomari I: "Initial Oxidation Process of Si(001) Simulated by Using a Parallel PC System"SEMICONDUCTORTECHNOLOGY 1. 242-246 (2001)
Watanabe T、Tatsumura K、Kajimoto A、Inaba Y、Ogura K、Ohdomari I:“使用并行 PC 系统模拟 Si(001) 的初始氧化过程”SEMICONDUCTORTECHNOLOGY 1. 242-246 (2001)
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
T. Tanii, T. Goto, T. lida, M. Koh-Masahara and L Ohdomari: "Sinp|le fabrication of silicon nanopyramids for high performance field emitter array"Ext. Abst. SSDM. 578-579 (2001)
T. Tanii、T. Goto、T. lita、M. Koh-Masahara 和 L Ohdomari:“用于高性能场发射体阵列的硅纳米金字塔的简单制造”Ext。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
T. Shinada, A. Ishikawa, C. Hinoshita, M. Koh, and I. Ohdomari: "Reduction of fluctuation in Semiconductor conductivity by one-by-one ion implantation of dopant atoms"Jpn. J. Appl. Phys.. 39. L265-L268 (2000)
T. Shinada、A. Ishikawa、C. Hinoshita、M. Koh 和 I. Ohdomari:“通过掺杂原子的一对一离子注入减少半导体电导率的波动”Jpn。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
43
    Novel semiconductors with controlled both single-atom number and position
    • 批准号:
      17201026
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $32.61万
    • 财政年份:
      2005
    • 负责人:
      ODOMARI Iwao
    • 依托单位:
    High-tenperature SIM observation under ion irradiation in order to modify surfaces in namscale
    • 批准号:
      11450019
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $9.22万
    • 财政年份:
      1999
    • 负责人:
      ODOMARI Iwao
    • 依托单位: