Development of Thermal Radiation Spectroscopy Technique for Diagnosis of Thermal Radiation Phenomena and Microstructure of Surfaces

工业环境中的表面与实验室中清洁的光学光滑表面有很大的不同。表面在显微镜下是粗糙的，并被任何表面薄膜覆盖。此外，在表面处理中，实现了表面微几何，并在表面上生长了薄膜。在工业环境中，表面微结构每时每刻都在发生变化。本研究的目标是，首先阐明此类表面的热辐射特性，以便进行换热评价；其次，发展一种诊断表面微观结构的热辐射技术。在2001/2002年间，我们研制了一套宽波长范围的高速分光光度测量系统。它是我们学习的主要硬件系统。它以2s为周期，同时、重复地测量了93个波长点在0.3-11μm波长范围内的反射和辐射发射光谱。该系统的有效性能是恶魔…尤其是金属的热辐射特性研究。2002/2003年，在此硬件的基础上，我们提出了一种分析每秒测量表面的反射光谱和发射光谱的算法，以诊断每秒测量表面的温度、微观粗糙度和薄膜厚度。通过实验验证了该算法的性能。该算法不考虑表面微结构变化引起的表面发射率的变化，只对温度进行了光学估计。从粗糙表面结构的自相关长度出发，分别估计了辐射漫反射表面的均方根粗糙度。该技术可作为非接触式在线诊断表面温度和微观结构的有力手段。在本研究中，还证实了表面膜系统的发射具有辐射干扰的特征。这一发现表明，我们有可能开发出一种新的功能性辐射能源，它可以在一定方向上发射特定波长的辐射。较少

Surfaces in industrial environments are far different from clean optically smooth surfaces in laboratories. The surfaces are microscopically rough and covered by any surface films. Also, in the surface processings, surface micro-geometry is realized and films are grown on the surfaces. The surface micro structure is changed at every second in the industrial environments. The targets of this study are, first, to clarify the thermal radiation characteristics of such surfaces for heat transfer evaluation, and second, to develop a thermal radiation technique for diagnosing the surface microstructure. Hard- and soft-wares are presented.In 2001/2002, we had developed a wide-wavelength range high-speed spectrophotometer system. It is the main hard-ware system for our study. It measures the spectra of reflection and emission of radiation of 93 wavelength points in a 0.3-11μm wavelength range simultaneously and repeatedly by a cycle time of 2s. The effective performance of this system is demons … More trated in the thermal radiation characteristic study on metals. In 2002/2003, on the basis of this hard-ware, we presented an algorithm for analyzing the reflection and emission spectra of surfaces measured at every second to diagnose the temperature, micro-roughness and film thickness of the surfaces at every second. The performance of the algorithm was demonstrated by experimental examinations. By the algorithm, the temperature is estimated optically without the information of the surface emittance which is changing due to the change in the surface microstructure. The root-mean-squares roughness of the diffuse-reflecting surfaces of radiation is estimated separately from the self-correlation length of the rough surface structure. The present technique can be a strong technique for the non-contact in-process diagnosis of temperature and microstructure of surfaces. In the present study, it was also confirmed that the emission of the surface film systems is characterized by the interference of radiation. This finding suggests that we have a possibility to develop a new functional radiation energy source which emits radiation of a certain wavelength in a certain direction. Less