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Development of High-Speed Spectroscopy for Measurement of Thermal Radiation Phenomena of Surfaces

表面热辐射现象测量高速光谱学的发展

基本信息

批准号：
08555055
负责人：
MAKINO Toshiro
金额：
$ 5.63万
依托单位：
KYOTO UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1996
资助国家：
日本
起止时间：
1996 至 1997
项目状态：
已结题

项目摘要

This research is a developmental work of high-speed spectroscopy for the measurement of thermal radiation phenomena of surfaces. It contributes to fundamental researches on thermal radiation characteristics of real surfaces and to development of a new surface diagnosis technique using radiation.First, we developed a high-speed spectrophotometer system, which covers by one system a wide spectral region from visible to infrared. This system consists of two kinds of light sources, and four sets of spectrometers and detector element arrays (99 elements in total). The four spectrometer parts are linked by computer-controlled motors, and outputs of the 99 elements are electronically scanned to realize the fast spectrum measurement. We used this sytem in a wavelength region of lambda=0.35-5.5mum to measure the transition of reflection and emission spectra of metal surfaces in an air-oxidation process at high temperatures. Measured phenomena of radiation interference and diffraction suggested … More the mechanism of oxide flim growth and roughness cleation on the film surfaceSecond, we presented an algorithm of an in-process surface diagnosis technique based on a high-speed spectrum measurement. This algorithm covers the following case : A specular-finished metal surface with a very thin surface film in the initial state, changes gradually to an oxidized rough surface. On such a surface, (-rheta)-direction emission energy u_i and specular-direction reflection energy v_i for rheta-direction incidence are measured repeatedly at wavelengths of lambda_i (i=1,2, ・・・n). The measured data are analyzed time by time to evaluate the surface temperature T,spectra of (-rheta)-direction emittance epsilon, specular-direction reflectance R for rheta-direction incidence, a spectrum of optical constant n^^-of the surface film, average film thickness d and rms roughness sigma of the film surface. The developed spectrophotometer system is utilized at 16 wavelength points in a spectral region of lambda=1.1-1.8mum to measure simultaneously emission and reflection spectra of a surface in the above-mentioned oxidation process. The results are analyzed on a basis of the present algorithm. It is demonstrated that the present technique can evaluate the surface temeperature with a fair accuracy and that the surface quantities with a good precision. Less

本研究是高速光谱技术在表面热辐射现象测量中的发展。这对真实的表面的热辐射特性的基础研究和利用辐射进行表面诊断的新技术的发展具有重要的意义。首先，我们研制了一套高速分光光度计系统，该系统覆盖了从可见光到红外的宽光谱范围。该系统由两种光源、四套光谱仪和探测器元件阵列（共99个元件）组成。四个光谱仪部分由计算机控制的电机连接，99个元素的输出被电子扫描，以实现快速光谱测量。我们用这个系统在λ =0.35- 5.5 μ m的波长范围内测量了金属表面在高温空气氧化过程中的反射光谱和发射光谱的转变。提出了辐射干涉和衍射的测量现象 ...更多信息其次，提出了一种基于高速光谱测量的在线表面诊断技术的算法。该算法涵盖以下情况：初始状态具有非常薄的表面膜的镜面抛光金属表面逐渐变化为氧化的粗糙表面。在这样的表面上，在λ_i（i= 1，2，···n）波长处重复测量了（-rheta）方向的发射能量u_i和rheta方向入射的镜面反射能量v_i。对测量数据进行逐时间分析，以评估表面温度T、（-rheta）方向发射率的光谱、rheta方向入射的镜面反射率R、表面膜的光学常数的光谱、膜表面的平均膜厚度d和均方根粗糙度σ。利用所研制的分光光度计系统在λ =1.1- 1.8 μ m的光谱区域内的16个波长点处同时测量上述氧化过程中表面的发射光谱和反射光谱。在此基础上对算法的结果进行了分析。结果表明，该方法能较准确地估算出表面温度，并能较好地估算出表面量。少