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Investigation of Optical Absorption Spectra of Extremely Thin Semiconductor Quantum Structure by a Piezoelectric Photothermal Spectroscopy

Investigation of Optical Absorption Spectra of Extremely Thin Semiconductor Quantum Structure by a Piezoelectric Photothermal Spectroscopy
利用压电光热光谱研究极薄半导体量子结构的光学吸收光谱
批准号:
15560020
负责人:
IKARI Tetsuo
金额:
$2.37万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2004

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中文摘要
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英文摘要
Optical absorption spectrum for GaInNAs/GaAs single quantum well structure was obtained precisely by means of our developed Piezoelectric Photothermal Spectroscopy(PPTS) with taking into account a photovoltaic effect. Since the thickness of the sample was extremely thin, usual absorption measurement technique was useless. Detailed analysis of the spectra gave us clear understandings both for two dimensional densities of states of the quantum levels in the conduction and valence bands and exciton formations. Since the present results made possible for precise fitting the line shape of the exciton absorption by a quasi-Voigt function, the binding energies of the exciton were accurately determined as a function of the well thickness and measuring temperature. Theoretical consideration for the binding energy and blue shift of the critical energies of the quantum levels were also carried out. We found that effective mass difference between inside and outside the quantum well and band offset ratio in the conduction band played important roles for generating the PPT spectra. Since the non-radiative intra-band transition determines the temperature dependence of the intensities of the PPT signal, we found the non-radiative transition pathways in the strained quantum well structures. At the same time, we could investigate the oxygen vacancies in the transparent conducting oxidize ZnO and the proton irradiation induced defect in chalcopyrite semiconductor thin films by using the present PPTS methodology. These results in this project make clear that the PPTS technology is a new and effective optical technique for investigating the quantum structure, including the wires and the dots, of the semiconductor devices.
期刊论文(64)
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会议论文
圧電素子光熱分光法による微結晶シリコン薄膜の光吸収スペクトル
压电光热光谱法研究微晶硅薄膜的光吸收光谱
DOI: --
发表时间: 2004
期刊: 超音波TECHNO 9-10月号
影响因子: --
作者: [碇 哲雄, 境健太郎, 福山敦彦]
通讯作者: 福山敦彦
Electron and hole trap levels in semi-insulating GaAs investigated by a temperature variation of piezoelectric photo-thermal spectra
通过压电光热光谱的温度变化研究半绝缘砷化镓中的电子和空穴陷阱能级
DOI: --
发表时间: 2003
期刊: Materials Science and Engineering B102
影响因子: --
作者: [A.Ito, S.Sato, S.Tada, S.Tanaka, A.Fukuyama, T.Ikari]
通讯作者: T.Ikari
K.Imai, T.Ikari, et al.: "Investigation of the Electron Nonradiative Transition in Extremely Thin CaInNAs/GaAs Single Quantum Well by Using a PPT Spectroscopy"Japanese Journal of Applied Physics. (Accepted). (2004)
K.Imai、T.Ikari 等人:“利用 PPT 光谱法研究极薄 CaInNAs/GaAs 单量子阱中的电子非辐射跃迁”日本应用物理学杂志。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
圧電素子光熱分光法による半導体薄膜の評価(総説)
使用压电光热光谱法评估半导体薄膜(评论)
DOI: --
发表时间: 2005
期刊: 日本光学会会誌 2月(掲載予定)
影响因子: --
作者: [碇 哲雄, 福山敦彦]
通讯作者: 福山敦彦
26
    Optical absorption spectra of semiconductor films measured bya photothermal technique with eliminating a scattering light
    • 批准号:
      22560024
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $2.91万
    • 财政年份:
      2010
    • 负责人:
      IKARI Tetsuo
    • 依托单位:
    海外基金