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Fluorescence Lifetime Imaging Microscope with time-correlated single photon counting

Fluorescence Lifetime Imaging Microscope with time-correlated single photon counting
具有时间相关单光子计数功能的荧光寿命成像显微镜
批准号:
467133067
负责人:
金额:
$0.0万
依托单位:
依托单位国家:
德国
项目类别:
Major Research Instrumentation
财政年份:
2021
资助国家:
德国
项目状态:
已结题
起止时间:
2020-12-31 至 2021-12-31

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中文摘要
翻译
拟议的光谱仪将促进一组安哈特大学最强大的研究科学家在太阳能电池和组件的效率提高和可靠性领域进行先进的基于仪器的研究。研究问题涉及材料疲劳、技术开发中的效率损失、生产和实际操作中的光伏元件翻译www.DeepL.com/Translator(免费版本)太阳能电池是半导体元件,嵌入聚合物保护层并作为模块进行交易。目标是实现尽可能高的产出效率,但也要在至少20年的运营中保持这种表现。这种长期稳定性目前在现场运行中还不能令人满意,而且也没有得到充分的研究。在某些情况下,由于降级造成的年度功率损失是满足保修要求所允许的最大功率损失的两倍。提出的光谱仪的目标之一是在实际操作条件下更好地理解半导体和聚合物性质在退化过程中的复杂相互作用。实际上,科学对延长寿命的贡献是可以期待的。所提出的光谱仪可以同时研究聚合物和半导体的降解。样品被不同波长的激光激发,这些激光通过光纤耦合到显微镜和样品上。信号被收集在同一个显微镜中,并通过光纤传递到光谱仪,用于时间相关的单光子计数或拉曼光谱仪。通过一台具有可变输出的显微镜,测量技术的组合使材料可以在完全相同的位置进行测量。因此,测量不受自然发生的材料变化或不均匀的影响。激光器和探测器的选择是为了确保相应的波长和测量速度。测量技术的组合允许协同使用,在许多情况下提供不能用单一技术测量的信息。该文书由三个工作组(工作组)联合申请。牵头申请者的工作组为集团带来了个人测量技术、计量、仪器开发和实验室管理方面的经验。工作组的工作方向是光伏组件的光伏能量产量相关度量和寿命能量预测。这位工作组领导人是一位国际知名的专家,多年来一直推动光伏组件可靠性的国际研究发展。他在半导体和聚合物领域都有经验。第二个工作组涉及半导体损耗机制及其降低。第三工作组在腐蚀现象和表面涂层方面有相关经验。工作组的所有领导人都是国际领先的科学家。
英文摘要
The proposed spectrometer will facilitate a group of Anhalt University's strongest research scientists to conduct advanced instrumentation-based research in the area of efficiency enhancement and reliability of solar cells and modules. The research questions concern material fatigue, efficiency losses in technology development, production and the operation of photovoltaic elements in real operationTranslated with www.DeepL.com/Translator (free version)Solar cells are semiconductor elements, embedded in polymer protective layers and traded as modules. The aim is to achieve the highest possible output efficiency, but also to maintain this performance for at least 20 years of operation. This long-term stability is currently unsatisfactory in field operation and moreover not sufficiently researched. The annual power loss due to degradation is in some cases twice as high as the maximum allowed to meet warranty requirements. One of the goals of the proposed spectrometer is to better understand the complex interaction of semiconductor and polymer properties during degratation unter realistic operating conditions. Scientific contributions to improved lifetime can realistically be expected. The proposed spectrometer can study both, polymer and semiconductor degradation. The samples are excited by lasers of different wavelengths, which are coupled through optical fibers into a microscope and onto the specimen. The signal is collected in the same microscope and passed via optical fibers into either a spectrometer for time-correlated single photon counting or a Raman spectrograph. The combination of measurement techniques via one microscope with variable outputs allows the materials to be measured at the very same location. Therefore, the measurements are not affected by naturally occurring material variations or inhomogeneities. The lasers and the detectors are chosen to ensure relevant wavelengths and measurement speeds. The combination of measurement techniques allows synergistic use that in many cases gives information that cannot be measured with a single technique. The instrument is jointly applied for by three working groups (WGs). The WG of the lead applicant brings experience in the individual measurement techniques, metrology, instrument development, and laboratory management to the group. The orientation of the WG is PV energy yield related metrology and lifetime energy prediction for PV modules. The WG leader is an internationally renowned expert who has been driving international research development in PV module reliability for years. He has experience in both semiconductor and polymer fields. The second WG deals with semiconductor loss mechanisms and their reduction. The third WG has relevant experience in corrosion phenomena and surface coatings. All WG leaders are internationally leading scientists.
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