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Nondestructive evaluation of ferroelectric domain structure poled and driven by electric fields of surface electrode pairs by ultrasonic atomic force microscopy

Nondestructive evaluation of ferroelectric domain structure poled and driven by electric fields of surface electrode pairs by ultrasonic atomic force microscopy
通过超声原子力显微镜对表面电极对电场极化和驱动的铁电畴结构进行无损评估
批准号:
17560627
负责人:
TSUJI Toshihiro
金额:
$2.3万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006

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中文摘要
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英文摘要
Scanning probe microscopy has revealed an origin of a polarization fatigue and a mechanism for improving ferroelectric thin films for memory devices and MEMS actuators. An observation method with a nanoscale resolution for observing domains during the device operation has not been established. In this study, ultrasonic atomic force microscopy (UAFM) that can measure elastic property on the nanoscale was combined with narrow gap of surface electrode pairs (SEP) fabricated on ferroelectric materials in order to establish the technique for the evaluation of ferroelectric materials in practical environment during the device operation. We used lead magnesium niobate - lead titanate single crystal (Pb(Mg_<2/3>Nb_<1/3>)O_3-PbTiO_3 : PMN-PT) as a sample that shows significantly high piezoelectric coefficient by poling in the direction along certain crystal orientation. As a result, an electric field of SEP was found to drive ferroelectric domain for the first time, although the topmost surface of the sample was depolarized by heating up during the vacuum deposition of Au/Cr thin film of SEP since low Curie temperature of 130℃. Then, the domain boundary of the depolarized structure was observed by UAFM, so that it was found to be tilted under the surface by small angle with respect to the observation plane. A subsurface imaging in PMN-PT with high dielectric constant is difficult in piezoresponse force microscopy that is generally used for imaging ferroelectric domain configuration, and it was demonstrated that UAFM is useful for analyzing 3D structure of subsurface defect. In conclusions, it was verified that the application of the electric field by SEP is useful for the nondestructive evaluation of ferroelectric domain structure by UAFM. From these results, the basis of UAFM evaluation of ferrolectrics using SEP was established, so that the purpose that was originally intended was achieved.
期刊论文(25)
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会议论文
Evaluation of ferroelectric domain boundary by ultrasonic atomic force microscopy using lateral bending mode
使用横向弯曲模式的超声原子力显微镜评估铁电畴边界
DOI: --
发表时间: 2006
期刊: Proceedings of symposium on ultrasonic electronics 27
影响因子: --
作者: [Toshihiro Tsuji, Kentaro Kobari, Seishiro Ide, Kazushi Yamanaka]
通讯作者: Kazushi Yamanaka
ultrasonic atomic force microscopy of domain structure in PMN-PT single crystal poled by using a surface electrode pair
使用表面电极对极化 PMN-PT 单晶中的域结构的超声原子力显微镜
DOI: --
发表时间: 2006
期刊: IEICE Technical Report US2006-25
影响因子: --
作者: [Seishiro Ide, Kentaro Kobari, Toshihiro Tsuji, Kazushi Ymanaka]
通讯作者: Kazushi Ymanaka
Depolarization domain structure induced by heat input on PMN-PT crystal
PMN-PT 晶体上热输入引起的去极化域结构
DOI: --
发表时间: 2007
期刊: Extended abstracts (The 54rd Spring meeting, 2006); The Japan Society of Applied Physics and Related Societies 464
影响因子: --
作者: [Seishiro Ide, Kentaro Kobari, Toshihiro Tsuji, Kazushi Ymanaka]
通讯作者: Kazushi Ymanaka
Suppression of spurious response in ultrasonic atomic force microscopy and quantitative analysis of lateral bending mode
超声原子力显微镜杂散响应的抑制及横向弯曲模式的定量分析
DOI: --
发表时间: 2006
期刊: IEICE Technical Report US2006-25
影响因子: --
作者: [Toshihiro Tsuji, Kentaro Kobari, Seishiro Ide, Kazushi Ymanaka]
通讯作者: Kazushi Ymanaka
20
    Sensitive polar gas sensor using active surface of piezoelectric crystals and ultra-long propagation of surface acoustic wave
    • 批准号:
      24686013
    • 项目类别:
      Grant-in-Aid for Young Scientists (A)
    • 资助金额:
      $15.97万
    • 财政年份:
      2012
    • 负责人:
      TSUJI Toshihiro
    • 依托单位:
    Development of ultrasonic atomic force microscopy for nondestructive evaluation of thin films
    • 批准号:
      21760577
    • 项目类别:
      Grant-in-Aid for Young Scientists (B)
    • 资助金额:
      $2.83万
    • 财政年份:
      2009
    • 负责人:
      TSUJI Toshihiro
    • 依托单位:
    Improrement of PIV Measurement Accuracy and Identification of Structures for Turbulent Flows
    • 批准号:
      14550178
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $2.18万
    • 财政年份:
      2002
    • 负责人:
      TSUJI Toshihiro
    • 依托单位:
    海外基金