Analysis of Multilayer Structure Constituted by Light-Elements with Total Reflection PIXE

全反射PIXE光元件多层结构分析

• 批准号: 09558056
• 负责人: SATOH Isamu
• 金额: $ 7.17万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 1997
• 资助国家: 日本
• 起止时间: 1997 至 1998
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-09558056/
• 关键词: total reflection PIXE; x-ray interference

The total reflection PIXE (TPIXE) line was constructed. Two multilayer samples were prepared. One was CaF_2 (lnm)/LiF (33nm)/Cu (l00nm) which was prepared on an optical flat quartz plate. The other was protein monolayer film which was placed on the flat glass plate coated with Cr.The Ca sample was bombarded with 1MeV proton beam in the total reflection conditions (TPIXE) and vertically conditions (PIXE). The characteristic x-ray interference fringes were observed. These fringes are generated between the direct emissions of x-ray from Ca and the emissions totally reflected by the substrate surface, and are measured by scanning the slit with a Si (Li) detector. The measurement of the interference fringes were carried out three times by TPIXE and PIXE.Almost same fringes were observed in TPIXE.These fringes was observed at first measurement, but could not be observed at second and third in PIXE.It is concluded that Ca sample was destroyed by the bombardment of the proton beam in vertically.The measurements of the take-off angle dependent of the characteristic x-ray from S in the protein monolayer film were carried out with TPIXE at 10ﾟC and -30ﾟC.From the analysis of the data of the take-off angle, the protein film was not destroyed by proton beam at -30ﾟC, but it was gradually destroyed at 10ﾟC.It was concluded that TPIXE could be applied to determine the site of the lite-element in the protein monolayer film.

构建了全反射PIXE(TPIXE)线。制备了两个多层样品。一种是在光学平板石英片上制备的CaF_2(LnM)/LiF(33 Nm)/Cu(100 Nm)。另一种是将蛋白质单层膜放置在镀铬的平板上，用1 MeV质子束在全反射(TPIXE)和垂直(PIXE)条件下轰击钙样品。观察到了典型的X射线干涉条纹。这些条纹是在钙的X射线直接发射和衬底表面完全反射的发射之间产生的，并通过用Si(Li)探测器扫描狭缝来测量。用TPIXE和PIXE对干涉条纹进行了三次测量，在TPIXE中观察到了几乎相同的条纹。在第一次测量中观察到了几乎相同的条纹，但在第二次和第三次PIXE中观察不到这些条纹。得出结论：钙样品是被垂直方向上的质子束轰击破坏的。在10ﾟC和-30ﾟC下，用TPIXE测量了蛋白质单层膜中依赖于S特征X射线的起飞角。从起飞角的数据分析，蛋白质膜没有被-30ﾟC的质子束破坏但在10ﾟC时，它逐渐被破坏。因此，TPIXE可以用来确定蛋白质单层膜中轻质元素的位置。