Analysis of Multilayer Structure Constituted by Light-Elements with Total Reflection PIXE

构造了全反射pixie （tpixie）线。制备了两种多层样品。一种是在光学平面石英板上制备的CaF_2 (lnm)/ liff (33nm)/Cu （l00nm）。另一种是蛋白质单层膜，将其放置在涂有cr的平板玻璃上。用1MeV质子束在全反射条件（tpxe）和垂直条件（PIXE）下轰击Ca样品。观察了特征x射线干涉条纹。这些条纹是在Ca的x射线直接发射和衬底表面完全反射的发射之间产生的，用Si （Li）探测器扫描狭缝来测量。利用TPIXE和PIXE对干涉条纹进行了三次测量。在tpxie中观察到几乎相同的条纹。这些条纹在第一次测量中被观察到，但在第二次和第三次测量中没有被观察到。结果表明，钙样品是在质子束的垂直轰击下被破坏的。在10和-30两种温度下，用tpxie测量了S在蛋白单层膜上的特征x射线的发射角。从起飞角数据分析可知，质子束在-30ºC时没有破坏蛋白膜，而在10ºC时则逐渐破坏蛋白膜。结果表明，tpxie可用于确定蛋白质单层膜中生命元素的位置。

The total reflection PIXE (TPIXE) line was constructed. Two multilayer samples were prepared. One was CaF_2 (lnm)/LiF (33nm)/Cu (l00nm) which was prepared on an optical flat quartz plate. The other was protein monolayer film which was placed on the flat glass plate coated with Cr.The Ca sample was bombarded with 1MeV proton beam in the total reflection conditions (TPIXE) and vertically conditions (PIXE). The characteristic x-ray interference fringes were observed. These fringes are generated between the direct emissions of x-ray from Ca and the emissions totally reflected by the substrate surface, and are measured by scanning the slit with a Si (Li) detector. The measurement of the interference fringes were carried out three times by TPIXE and PIXE.Almost same fringes were observed in TPIXE.These fringes was observed at first measurement, but could not be observed at second and third in PIXE.It is concluded that Ca sample was destroyed by the bombardment of the proton beam in vertically.The measurements of the take-off angle dependent of the characteristic x-ray from S in the protein monolayer film were carried out with TPIXE at 10ﾟC and -30ﾟC.From the analysis of the data of the take-off angle, the protein film was not destroyed by proton beam at -30ﾟC, but it was gradually destroyed at 10ﾟC.It was concluded that TPIXE could be applied to determine the site of the lite-element in the protein monolayer film.