Research for Standarization of Evaluation Method of Radiation Effects in Material after Particle Irradiation

在本研究的三年时间里，研究任务主要是通过五个工作组的活动进行的。这些工作组(W.G.)具体内容如下：(1)损伤计算与评价W.G.；(2)机器推算W.G.；(3)辐照参数测量与评价W.G.；(4)力学性能分析与评价W.G.；(5)显微组织分析与评价W.G.这项研究的主要目的是建立一种标准的辐射和辐射后实验的技术或方法，该技术或方法通常可用于研究辐射效应的研究人员。根据这一目标，我们将以下三个项目作为实际研究目标：(A)粒子辐照实验硬件系统的标准化，(B)粒子辐照后微观结构的样品制备和电子显微镜检查方法的标准化，(C)损伤计算方法的标准化和计算机程序的推荐。本文的主要研究成果如下：(1)为了与试验结果相吻合，对电子制动参数计算程序E-DEP-1和TRIM进行了改进，并给出了新版本的程序。(2)制定了离子束测量的硬件规格，如束流强度分布测量。研制了用于粒子辐照实验的样品加热和精密温度控制系统，并将其作为辐照实验的标准系统。(3)对粒子辐照后的电子显微镜样品制备方法进行了标准化，重点介绍了表面切片和背面减薄技术。从电子显微镜照片中获取数据的程序也被标准化。

For three years of this research, research tasks were performed mainly through the activities of five working groups. Those working groups (W.G.) were as follows, (1)Damage Calculation and Evaluation W.G., (2)Machine betting Up W.G., (3) Irradiation Parameter Measurement and Evaluation W.G., (4)Mechanical Property Analysis and Evaluation W.G., (5)Microstructure Analysis and Evaluation W.G.. The major objective of this research was to establish a standard technique or method of irradiation and post-irradiation experimonts which was commonly available for research workers on ridiation effects. In conformity to this objective we employed follwing three task items as practical research aims; (a) Standarization of hardware systems for particle irradiation experiment, (b) Standarization of sample preparation and TEM inspection method of microstructure after particle irradiation, (c) Standarization of damage calculation method and recommendation of computer code. The results of this research are summarized as follows, (i) Two computer codes for damage calculation, E-DEP-1 and TRIM, were inproved on the electronic stopping parameter in order to conform to experimental results, and the new version of those codes were presented. (ii) Hardware specifications in ion-beam measurements such as beam intensity distribution measurement were established. Specimen heating and precise temperature control system for particle irradiation experiment was developed and employed as standard system in irradiation experiment. (iii) Specimen preparation methods for transmission electron microscopy after particle irradiation were standarized with emphasis on surface sectioning and back thinning techniques. Procedure for data acquisition from TEM photo-micrograph was also standarized.